Issued Patents All Time
Showing 1–24 of 24 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7709911 | Semiconductor device having silicide transistors and non-silicide transistors formed on the same substrate and method for fabricating the same | Masayuki Kamei, Takayuki Yamada | 2010-05-04 |
| 7495295 | Semiconductor device and method for fabricating the same | Kentaro Nakanishi, Atsuhiro Kajiya | 2009-02-24 |
| 7126174 | Semiconductor device and method of manufacturing the same | Mizuki Segawa, Toshiki Yabu, Takashi Nakabayashi, Takashi Uehara, Kyoji Yamashita +4 more | 2006-10-24 |
| 7057236 | Semiconductor device and manufacturing method thereof | Takayuki Yamada | 2006-06-06 |
| 7033874 | Method of forming insulating film and method of fabricating semiconductor device including plasma bias for forming a second insulating film | Kazuichiro Itonaga, Akihiro Yamamoto, Hiroaki Nakaoka, Yoshinao Harada | 2006-04-25 |
| 6974987 | Semiconductor device | Hisashi Ogawa, Koji Eriguchi, Takayuki Yamada, Kazuichiro Itonaga, Yoshihiro Mori | 2005-12-13 |
| 6967409 | Semiconductor device and method of manufacturing the same | Mizuki Segawa, Toshiki Yabu, Takashi Nakabayashi, Takashi Uehara, Kyoji Yamashita +4 more | 2005-11-22 |
| 6890824 | Semiconductor device and manufacturing method thereof | Takayuki Yamada | 2005-05-10 |
| 6800512 | Method of forming insulating film and method of fabricating semiconductor device | Kazuichiro Itonaga, Akihiro Yamamoto, Hiroaki Nakaoka, Yoshinao Harada | 2004-10-05 |
| 6709950 | Semiconductor device and method of manufacturing the same | Mizuki Segawa, Toshiki Yabu, Takashi Nakabayashi, Takashi Uehara, Kyoji Yamashita +4 more | 2004-03-23 |
| 6323663 | Semiconductor wafer package, method and apparatus for connecting testing IC terminals of semiconductor wafer and probe terminals, testing method of a semiconductor integrated circuit, probe card and its manufacturing method | Yoshirou Nakata, Toshio Yamada, Atsushi Fujiwara, Shin Hashimoto, Yukiharu Uraoka +2 more | 2001-11-27 |
| 6281562 | Semiconductor device which reduces the minimum distance requirements between active areas | Mizuki Segawa, Toshiki Yabu, Takashi Nakabayashi, Takashi Uehara, Kyoji Yamashita +4 more | 2001-08-28 |
| 6005401 | Semiconductor wafer package, method and apparatus for connecting testing IC terminals of semiconductor wafer and probe terminals, testing method of a semiconductor integrated circuit, probe card and its manufacturing method | Yoshirou Nakata, Toshio Yamada, Atsushi Fujiwara, Shin Hashimoto, Yukiharu Uraoka +2 more | 1999-12-21 |
| 5945834 | Semiconductor wafer package, method and apparatus for connecting testing IC terminals of semiconductor wafer and probe terminals, testing method of a semiconductor integrated circuit, probe card and its manufacturing method | Yoshirou Nakata, Toshio Yamada, Atsushi Fujiwara, Shin Hashimoto, Yukiharu Uraoka +2 more | 1999-08-31 |
| 5892368 | Semiconductor integrated circuit device having failure detection circuitry | Yoshiro Nakata, Shin Hashimoto | 1999-04-06 |
| 5843844 | Probe sheet and method of manufacturing the same | — | 1998-12-01 |
| 5825193 | Semiconductor integrated circuit device | Yoshiro Nakata, Shin Hashimoto | 1998-10-20 |
| 5693557 | Method of fabricating a semiconductor device | Shuji Hirao, Hisashi Ogawa, Yuka Terai, Mitsuru Sekiguchi, Masanori Fukumoto | 1997-12-02 |
| 5675168 | Unsymmetrical MOS device having a gate insulator area offset from the source and drain areas, and ESD protection circuit including such a MOS device | Kyoji Yamashita, Shinji Odanaka, Kazumi Kurimoto, Akira Hiroki, Atsushi Hori | 1997-10-07 |
| 5661068 | Method of fabricating a semiconductor device | Shuji Hirao, Hisashi Ogawa, Yuka Terai, Mitsuru Sekiguchi, Masanori Fukumoto | 1997-08-26 |
| 5514893 | Semiconductor device for protecting an internal circuit from electrostatic damage | Kazumi Kurimoto, Atsushi Hori, Shinji Odanaka | 1996-05-07 |
| 5474949 | Method of fabricating capacitor or contact for semiconductor device by forming uneven oxide film and reacting silicon with metal containing gas | Shuji Hirao, Hisashi Ogawa, Yuka Terai, Mitsuru Sekiguchi, Masanori Fukumoto | 1995-12-12 |
| 5451799 | MOS transistor for protection against electrostatic discharge | Kazumi Kurimoto, Atsushi Hori | 1995-09-19 |
| 5418187 | Method for extending electrically conductive layer into electrically insulating layer | Yasushi Okuda | 1995-05-23 |