Issued Patents All Time
Showing 1–25 of 43 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8260031 | Pattern inspection apparatus, pattern inspection method, and computer-readable recording medium storing a program | — | 2012-09-04 |
| 8233698 | Pattern inspection apparatus, corrected image generation method, and computer-readable recording medium storing program | — | 2012-07-31 |
| 8013361 | Semiconductor device and method for fabricating the same | Katsuhiro Otani, Katsuya Arai, Daisaku Ikoma | 2011-09-06 |
| 7809181 | Pattern inspection apparatus, image alignment method, displacement amount estimation method, and computer-readable recording medium with program recorded thereon | — | 2010-10-05 |
| 7792663 | Circuit simulation method | Daisaku Ikoma, Yasuyuki Sahara, Katsuhiro Ootani, Tomoyuki Ishizu | 2010-09-07 |
| 7709900 | Semiconductor device | Daisaku Ikoma, Atsuhiro Kajiya, Katsuhiro Ootani | 2010-05-04 |
| 7655904 | Target workpiece inspection apparatus, image alignment method, and computer-readable recording medium with program recorded thereon | — | 2010-02-02 |
| 7577288 | Sample inspection apparatus, image alignment method, and program-recorded readable recording medium | — | 2009-08-18 |
| 7562327 | Mask layout design improvement in gate width direction | Shinsaku Sekido, Katsuhiro Ootani, Yasuyuki Sahara, Daisaku Ikoma | 2009-07-14 |
| 7551767 | Pattern inspection apparatus | Hideo Tsuchiya, Toshiyuki Watanabe, Ikunao Isomura, Toru Tojo, Yasushi Sanada | 2009-06-23 |
| 7519593 | Data searching system, method of synchronizing metadata and data searching apparatus | Kazuko Abe, Junichi Yamamoto, Rei Yano, Masataka Yamada, Yasuhide Kurosaki +2 more | 2009-04-14 |
| 7476957 | Semiconductor integrated circuit | Shinji Watanabe, Daisaku Ikoma, Katsuhiro Ootani | 2009-01-13 |
| 7421109 | Pattern inspection apparatus | Hideo Tsuchiya, Toshiyuki Watanabe, Ikunao Isomura, Toru Tojo, Yasushi Sanada | 2008-09-02 |
| 7415149 | Pattern inspection apparatus | Hideo Tsuchiya, Toshiyuki Watanabe, Ikunao Isomura, Toru Tojo, Yasushi Sanada | 2008-08-19 |
| 7279727 | Semiconductor device | Daisaku Ikoma, Atsuhiro Kajiya, Katsuhiro Ootani | 2007-10-09 |
| 7230435 | Capacitance measurement circuit | Tatsuya Kunikiyo, Tetsuya Watanabe, Toshiki Kanamoto | 2007-06-12 |
| 7209584 | Pattern inspection apparatus | Hideo Tsuchiya, Shinji Sugihara, Toshiyuki Watanabe, Kazuhiro Nakashima | 2007-04-24 |
| 7171640 | System and method for operation verification of semiconductor integrated circuit | Yuka Terai | 2007-01-30 |
| 7126174 | Semiconductor device and method of manufacturing the same | Mizuki Segawa, Isao Miyanaga, Toshiki Yabu, Takashi Nakabayashi, Takashi Uehara +4 more | 2006-10-24 |
| 7032208 | Defect inspection apparatus | — | 2006-04-18 |
| 6982555 | Semiconductor device | Tatsuya Kunikiyo, Tetsuya Watanabe, Toshiki Kanamoto | 2006-01-03 |
| 6967409 | Semiconductor device and method of manufacturing the same | Mizuki Segawa, Isao Miyanaga, Toshiki Yabu, Takashi Nakabayashi, Takashi Uehara +4 more | 2005-11-22 |
| 6894520 | Semiconductor device and capacitance measurement method | Hiroyuki Umimoto, Mutsumi Kobayashi, Katsuhiro Ohtani, Tatsuya Kunikiyo, Katsumi Eikyu | 2005-05-17 |
| 6883160 | Pattern inspection apparatus | Hideo Tsuchiya, Shinji Sugihara, Toshiyuki Watanabe, Kazuhiro Nakashima | 2005-04-19 |
| 6876208 | Semiconductor device and method of checking semiconductor storage device | Tatsuya Kunikiyo, Katsumi Eikyu, Katsuhiro Ohtani, Hiroyuki Umimoto, Mutsumi Kobayashi | 2005-04-05 |