Issued Patents All Time
Showing 26–43 of 43 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6709950 | Semiconductor device and method of manufacturing the same | Mizuki Segawa, Isao Miyanaga, Toshiki Yabu, Takashi Nakabayashi, Takashi Uehara +4 more | 2004-03-23 |
| 6594598 | Method for controlling production line | Hiroaki Ishizuka | 2003-07-15 |
| 6492672 | Semiconductor device | Mizuki Segawa, Toshiki Yabu, Takashi Uehara, Takashi Nakabayashi, Takaaki Ukeda +2 more | 2002-12-10 |
| 6396943 | Defect inspection method and defect inspection apparatus | — | 2002-05-28 |
| 6281562 | Semiconductor device which reduces the minimum distance requirements between active areas | Mizuki Segawa, Isao Miyanaga, Toshiki Yabu, Takashi Nakabayashi, Takashi Uehara +4 more | 2001-08-28 |
| 6205570 | Method for designing LSI circuit pattern | — | 2001-03-20 |
| 6124160 | Semiconductor device and method for manufacturing the same | Mizuki Segawa, Toshiki Yabu, Takashi Uehara, Takashi Nakabayashi, Takaaki Ukeda +2 more | 2000-09-26 |
| 6084716 | Optical substrate inspection apparatus | Yasushi Sanada, Toru Tojo, Mitsuo Tabata, Hideo Nagai, Noboru Kobayashi +3 more | 2000-07-04 |
| 5879983 | Semiconductor device and method for manufacturing the same | Mizuki Segawa, Toshiki Yabu, Takashi Uehara, Takashi Nakabayashi, Takaaki Ukeda +2 more | 1999-03-09 |
| 5856754 | Semiconductor integrated circuit with parallel/serial/parallel conversion | — | 1999-01-05 |
| 5844809 | Method and apparatus for generating two-dimensional circuit pattern | — | 1998-12-01 |
| 5841173 | MOS semiconductor device with excellent drain current | — | 1998-11-24 |
| 5675168 | Unsymmetrical MOS device having a gate insulator area offset from the source and drain areas, and ESD protection circuit including such a MOS device | Shinji Odanaka, Kazumi Kurimoto, Akira Hiroki, Isao Miyanaga, Atsushi Hori | 1997-10-07 |
| 5610430 | Semiconductor device having reduced gate overlapping capacitance | Shinji Odanaka, Kazumi Kurimoto, Hiroyuki Umimoto | 1997-03-11 |
| 5404410 | Method and system for generating a bit pattern | Toru Tojo, Hideo Tsuchiya, Mitsuo Tabata, Ryoichi Yoshikawa | 1995-04-04 |
| 5185812 | Optical pattern inspection system | Ryoichi Yoshikawa, Masakazu Tokita | 1993-02-09 |
| 5100234 | Method and apparatus for aligning two objects, and method and apparatus for providing a desired gap between two objects | Yoriyuki Ishibashi, Ryoichi Hirano | 1992-03-31 |
| 4988197 | Method and apparatus for aligning two objects, and method and apparatus for providing a desired gap between two objects | Yoriyuki Ishibashi, Ryoichi Hirano | 1991-01-29 |