Issued Patents All Time
Showing 1–25 of 60 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12388753 | Control device, control method, and non-transitory recording medium for storing instruction for transmitting requests | Mitsuo AMASAKA, Takayuki Nakamura, Takuya Sato | 2025-08-12 |
| 11805098 | Communication system and communication method | Shinya KAWANO, Hiroaki Sato, Akihiro Okada | 2023-10-31 |
| 11757779 | Load distribution system and load distribution method | Akihiro Kimura, Shinya KAWANO, Akihiro Okada, Katsuma Miyamoto | 2023-09-12 |
| 11632331 | Load distribution system and load distribution method | Akihiro Kimura, Shinya KAWANO, Akihiro Okada, Katsuma Miyamoto | 2023-04-18 |
| 11463515 | Management device and management method | Katsuma Miyamoto, Akihiro Okada | 2022-10-04 |
| 11394571 | Notification device and notification method | Shunsuke Homma, Shinya KAWANO | 2022-07-19 |
| 11388019 | Function management apparatus, function management method and communication system | Hideaki Iwata, Akihiro Okada, Shunsuke Homma, Akihiro Kimura, Katsuma Miyamoto | 2022-07-12 |
| 11343223 | Communication apparatus, communication method and program | Katsuma Miyamoto, Hideaki Iwata, Akihiro Okada, Shunsuke Homma, Akihiro Kimura | 2022-05-24 |
| 11128569 | Load distribution system and load distribution method | Akihiro Kimura, Hideaki Iwata, Akihiro Okada, Shunsuke Homma, Katsuma Miyamoto | 2021-09-21 |
| 11004193 | Inspection method and inspection apparatus | Ryoichi Hirano, Masataka Shiratsuchi, Hideaki Hashimoto, Riki Ogawa | 2021-05-11 |
| 10984525 | Pattern inspection method and pattern inspection apparatus | Ryoichi Hirano, Masataka Shiratsuchi, Hideaki Hashimoto, Riki Ogawa | 2021-04-20 |
| 10846846 | Pattern inspection apparatus and pattern inspection method | Masataka Shiratsuchi, Riki Ogawa, Hideaki Hashimoto, Kazuhiro Nakashima, Ryoichi Hirano +1 more | 2020-11-24 |
| 10775326 | Electron beam inspection apparatus and electron beam inspection method | Masataka Shiratsuchi, Ryoichi Hirano, Hideaki Hashimoto, Riki Ogawa | 2020-09-15 |
| 10712295 | Electron beam inspection apparatus and electron beam inspection method | Masataka Shiratsuchi, Ryoichi Hirano, Hideaki Hashimoto, Riki Ogawa | 2020-07-14 |
| 10600176 | Inspection method and inspection apparatus | — | 2020-03-24 |
| 10504219 | Inspection apparatus and inspection method | Nobutaka Kikuiri | 2019-12-10 |
| 10410824 | Electron beam inspection apparatus and electron beam inspection method | — | 2019-09-10 |
| 10359370 | Template substrate for use in adjusting focus offset for defect detection | Riki Ogawa | 2019-07-23 |
| 10026011 | Mask inspection apparatus, mask evaluation method and mask evaluation system | Nobutaka Kikuiri, Ikunao Isomura | 2018-07-17 |
| 10019764 | Work management system and work management method | Sadao Sugiyama, Hiroyuki Ishibashi, Shiro Sugihara, Kiyoshi Yoshikawa | 2018-07-10 |
| 9959578 | Work management system and work management method | Sadao Sugiyama, Hiroyuki Ishibashi, Shiro Sugihara, Kiyoshi Yoshikawa | 2018-05-01 |
| 9953375 | Work management system and work management method | Sadao Sugiyama, Hiroyuki Ishibashi, Shiro Sugihara, Kiyoshi Yoshikawa | 2018-04-24 |
| 9953374 | Work management system and work management method | Sadao Sugiyama, Hiroyuki Ishibashi, Shiro Sugihara, Kiyoshi Yoshikawa | 2018-04-24 |
| 9953376 | Work management system and work management method | Sadao Sugiyama, Hiroyuki Ishibashi, Shiro Sugihara, Kiyoshi Yoshikawa | 2018-04-24 |
| 9804103 | Inspection method, template substrate, and focus offset method | Riki Ogawa | 2017-10-31 |