Issued Patents All Time
Showing 25 most recent of 32 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12382727 | Semiconductor chip, semiconductor device and manufacturing method of semiconductor device | Yoshito Tanaka | 2025-08-05 |
| 11942471 | Semiconductor chip, semiconductor device and manufacturing method of semiconductor device | Yoshito Tanaka | 2024-03-26 |
| 11890994 | On-board bracket for on-board device at vehicle | Takanori OTAKE, Shohei Seko | 2024-02-06 |
| 11321042 | Display system and program | Masahiro Sugumi, Airi Kurokawa, Tatsuya Nakamura, Wei Song | 2022-05-03 |
| 11189459 | Multibeam inspection apparatus | Riki Ogawa | 2021-11-30 |
| 11099801 | Display system and program | Masahiro Sugumi, Airi Kurokawa, Tatsuya Nakamura, Wei Song | 2021-08-24 |
| 11004193 | Inspection method and inspection apparatus | Ryoichi Hirano, Hideo Tsuchiya, Masataka Shiratsuchi, Riki Ogawa | 2021-05-11 |
| 10997713 | Inspection device, inspection method, and storage medium | Takeshi Morino, Hideaki Okano, Yoshinori Honguh, Ryoichi Hirano, Masataka Shiratsuchi | 2021-05-04 |
| 10984525 | Pattern inspection method and pattern inspection apparatus | Ryoichi Hirano, Hideo Tsuchiya, Masataka Shiratsuchi, Riki Ogawa | 2021-04-20 |
| 10846846 | Pattern inspection apparatus and pattern inspection method | Masataka Shiratsuchi, Riki Ogawa, Kazuhiro Nakashima, Ryoichi Hirano, Hideo Tsuchiya +1 more | 2020-11-24 |
| 10775326 | Electron beam inspection apparatus and electron beam inspection method | Hideo Tsuchiya, Masataka Shiratsuchi, Ryoichi Hirano, Riki Ogawa | 2020-09-15 |
| 10712295 | Electron beam inspection apparatus and electron beam inspection method | Hideo Tsuchiya, Masataka Shiratsuchi, Ryoichi Hirano, Riki Ogawa | 2020-07-14 |
| 9978316 | Display apparatus and backlight drive method | Akinori Hayashi, Masaaki Murai, Daiki Takeda | 2018-05-22 |
| 9646374 | Line width error obtaining method, line width error obtaining apparatus, and inspection system | Hideki Nukada, Kazuhiko Inoue | 2017-05-09 |
| 9575010 | Inspection apparatus and inspection method | Riki Ogawa, Nobutaka Kikuiri | 2017-02-21 |
| 9322388 | Natural-frequency adjusting mechanism for wave-power generator | Kentaro Hayashi, Takeshi Yasunaga, Shunichi Ikesue, Makoto Ohta, Masami Miura +4 more | 2016-04-26 |
| 9196033 | Inspection sensitivity evaluation method | Nobutaka Kikuiri | 2015-11-24 |
| 9021406 | Pattern inspection method of semiconductor device optical image | — | 2015-04-28 |
| 7765023 | Robot controller and robot controlling method | Junji Oaki, Fumio Ozaki, Hirokazu Sato | 2010-07-27 |
| 7570005 | Wheeled moving robot | Takafumi Sonoura | 2009-08-04 |
| 7522636 | System for controlling a plurality of equipments | Hirokazu Sato, Junji Ooaki, Fumio Ozaki | 2009-04-21 |
| 7397214 | Wheeled moving robot | Takafumi Sonoura | 2008-07-08 |
| 6551493 | Ultraviolet light measuring chip and ultraviolet light sensor using the same | Kazuyoshi Mori, Takeshi Nishida | 2003-04-22 |
| 6146514 | Apparatus and method for measuring acidity | Kiyoko Takamura, Fumiyo Kusu, Takeshi Nishida, Hidefumi Yabu, Kazuyoshi Mori +5 more | 2000-11-14 |
| 5373747 | Robot hand and robot | Hideki Ogawa, Masao Obama, Takao Furukawa, Toshiya Umeda | 1994-12-20 |