Issued Patents All Time
Showing 1–25 of 29 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12372549 | Test carrier and carrier assembling apparatus | Kazuya Ohtani | 2025-07-29 |
| 12320852 | Passive carrier-based device delivery for slot-based high-volume semiconductor test system | Karthik Ranganathan, Gregory Cruzan, Samer Kabbani, Gilberto Oseguera, Ira Leventhal +1 more | 2025-06-03 |
| 12276676 | Test carrier and carrier assembling apparatus | Kazuya Ohtani | 2025-04-15 |
| 12174248 | Ergonomic loading for a test interface board (TIB) / burn-in-board (BIB) in a slot-based test system | Karthik Ranganathan, Gregory Cruzan, Gilberto Oseguera, Takayuki Shigihara | 2024-12-24 |
| 12140610 | Test carrier and carrier assembling apparatus | Kazuya Ohtani | 2024-11-12 |
| 11906548 | Test carrier and carrier assembling apparatus | Kazuya Ohtani | 2024-02-20 |
| 11808812 | Passive carrier-based device delivery for slot-based high-volume semiconductor test system | Karthik Ranganathan, Gregory Cruzan, Samer Kabbani, Gilberto Oseguera, Ira Leventhal +1 more | 2023-11-07 |
| 11693026 | Test carrier | — | 2023-07-04 |
| 11579187 | Test carrier and electronic component testing apparatus | Yuya Yamada | 2023-02-14 |
| 11531043 | Test carrier and carrier assembling apparatus | Kazuya Ohtani | 2022-12-20 |
| 9588142 | Electronic device handling apparatus and electronic device testing apparatus | Koya Karino, Daisuke Takano | 2017-03-07 |
| 9121901 | Semiconductor wafer test apparatus | Takashi Naito | 2015-09-01 |
| 8513962 | Wafer tray and test apparatus | Yoshiharu Umemura | 2013-08-20 |
| 8493083 | Test apparatus, test method and computer readable medium | — | 2013-07-23 |
| 8299935 | Test apparatus and test method | Toshikazu Okawa | 2012-10-30 |
| 7298156 | Electronic part test apparatus | Hiroshi Okuda, Haruki Nakajima | 2007-11-20 |
| 6590383 | Contact arm and electronic device testing apparatus using the same | Tsuyoshi Yamashita | 2003-07-08 |
| 6456062 | Contact arm and electronic device testing apparatus using the same | Tsuyoshi Yamashita | 2002-09-24 |
| 6445203 | Electric device testing apparatus | Tsuyoshi Yamashita, Yoshihito Kobayashi, Hiroto Nakamura, Noriyuki Igarashi, Kenichi Shimada | 2002-09-03 |
| 6313653 | IC chip tester with heating element for preventing condensation | Hiroyuki Takahashi, Akio Kojima | 2001-11-06 |
| D442568 | IC module insert | Yoshiyuki Masuo, Hiroyuki Takahashi | 2001-05-22 |
| 6218849 | Device for detecting proper mounting of an IC for testing in an IC testing apparatus | — | 2001-04-17 |
| 6019564 | Semiconductor device transporting and handling apparatus | Takao Murayama | 2000-02-01 |
| 5920192 | Integrated circuit transporting apparatus including a guide with an integrated circuit positioning function | — | 1999-07-06 |
| 5812409 | Semiconductor device transport system with deformed tray compensation | Yukio Kanno | 1998-09-22 |