KR

Karthik Ranganathan

AS Advantest Test Solutions: 30 patents #1 of 31Top 4%
DP Dell Products: 6 patents #1,092 of 6,820Top 20%
YU Yugabyte: 5 patents #1 of 10Top 10%
Meta: 5 patents #1,418 of 6,845Top 25%
Becton, Dickinson And: 3 patents #937 of 2,926Top 35%
Microsoft: 1 patents #24,826 of 40,388Top 65%
AE Arris Enterprises: 1 patents #692 of 1,262Top 55%
IP Intervoice Limited Partnership: 1 patents #42 of 85Top 50%
NU Nutanix: 1 patents #340 of 579Top 60%
UV University of Virginia: 1 patents #483 of 1,170Top 45%
Overall (All Time): #43,621 of 4,157,543Top 2%
56
Patents All Time

Issued Patents All Time

Showing 25 most recent of 56 patents

Patent #TitleCo-InventorsDate
12411167 Tension-based socket gimbal for engaging device under test with thermal array Gregory Cruzan, Gilberto Oseguera, Joe Koeth, Paul Ferrari, James Hastings +1 more 2025-09-09
12374420 Carrier based high volume system level testing of devices with pop structures Gregory Cruzan, Samer Kabbani, Gilberto Oseguera, Ira Leventhal 2025-07-29
12345756 Integrated test cell using active thermal interposer (ATI) with parallel socket actuation Gregory Cruzan, Samer Kabbani, Gilberto Oseguera, Rohan Gupte, Homayoun Rezai +2 more 2025-07-01
12320841 Wafer scale active thermal interposer for device testing Samer Kabbani, Paul Ferrari, Ikeda Hiroki, Kiyokawa Toshiyuki, Gregory Cruzan 2025-06-03
12320852 Passive carrier-based device delivery for slot-based high-volume semiconductor test system Gregory Cruzan, Samer Kabbani, Gilberto Oseguera, Ira Leventhal, Hiroki Ikeda +1 more 2025-06-03
12235314 Parallel test cell with self actuated sockets Gilberto Oseguera, Gregory Cruzan, Joe Koeth, Ikeda Hiroki, Kiyokawa Toshiyuki 2025-02-25
12216154 Active thermal interposer device Samer Kabbani, Paul Ferrari, Ikeda Hiroki, Kiyokawa Toshiyuki, Gregory Cruzan +4 more 2025-02-04
12210056 Thermal array with gimbal features and enhanced thermal performance Gregory Cruzan, Gilberto Oseguera, Joe Koeth, Paul Ferrari, James Hastings +1 more 2025-01-28
12203958 Shielded socket and carrier for high-volume test of semiconductor devices Samer Kabbani, Gilberto Oseguera, Ira Leventhal, Koji Miyauchi, Keith Schaub +3 more 2025-01-21
12203979 Multi-input multi-zone thermal control for device testing Gregory Cruzan, Paul Ferrari, Samer Kabbani, Martin Fischer 2025-01-21
12174248 Ergonomic loading for a test interface board (TIB) / burn-in-board (BIB) in a slot-based test system Gregory Cruzan, Gilberto Oseguera, Toshiyuki Kiyokawa, Takayuki Shigihara 2024-12-24
12117890 Dynamically creating a contact address to customer support based on information associated with a computing device Vasudev Ka, Sathish Kumar Bikumala 2024-10-15
11978059 Guided problem resolution using machine learning Shalu Singh, Amit Sawhney, Mohammed Amin 2024-05-07
11940487 Thermal solution for massively parallel testing Samer Kabbani, Kazuyuki Yamashita, Ikeda Hiroki, Ira Leventhal, Mohammad Ghazvini +3 more 2024-03-26
11882177 Orchestration of data services in multiple cloud infrastructures Bharat Chandra Baddepudi, Bogdan-Alexandru Matican, Ramkumar Vaidyanathan Sri, Choudhury Sidharth, Mikhail Andreyevich Bautin +1 more 2024-01-23
11852678 Multi-input multi-zone thermal control for device testing Gregory Cruzan, Paul Ferrari, Samer Kabbani, Martin Fischer 2023-12-26
11846669 Active thermal interposer device Samer Kabbani, Paul Ferrari, Ikeda Hiroki, Kiyokawa Toshiyuki, Gregory Cruzan +4 more 2023-12-19
11841392 Integrated test cell using active thermal interposer (ATI) with parallel socket actuation Gregory Cruzan, Samer Kabbani, Gilberto Oseguera, Rohan Gupte, Homayoun Rezai +2 more 2023-12-12
11835549 Thermal array with gimbal features and enhanced thermal performance Gregory Cruzan, Gilberto Oseguera, Joe Koeth, Paul Ferrari, James Hastings +1 more 2023-12-05
11821913 Shielded socket and carrier for high-volume test of semiconductor devices Samer Kabbani, Gilberto Oseguera, Ira Leventhal, Koji Miyauchi, Keith Schaub +3 more 2023-11-21
11808812 Passive carrier-based device delivery for slot-based high-volume semiconductor test system Gregory Cruzan, Samer Kabbani, Gilberto Oseguera, Ira Leventhal, Hiroki Ikeda +1 more 2023-11-07
11774492 Test system including active thermal interposer device Samer Kabbani, Paul Ferrari, Ikeda Hiroki, Kiyokawa Toshiyuki, Gregory Cruzan +4 more 2023-10-03
11754620 DUT placement and handling for active thermal interposer device Samer Kabbani, Paul Ferrari, Ikeda Hiroki, Kiyokawa Toshiyuki, Gregory Cruzan +4 more 2023-09-12
11742055 Carrier based high volume system level testing of devices with pop structures Gregory Cruzan, Samer Kabbani, Gilberto Oseguera, Ira Leventhal 2023-08-29
11710145 Training a machine learning algorithm to create survey questions Sathish Kumar Bikumala 2023-07-25