Issued Patents All Time
Showing 25 most recent of 29 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12411167 | Tension-based socket gimbal for engaging device under test with thermal array | Karthik Ranganathan, Gilberto Oseguera, Joe Koeth, Paul Ferrari, James Hastings +1 more | 2025-09-09 |
| 12374420 | Carrier based high volume system level testing of devices with pop structures | Karthik Ranganathan, Samer Kabbani, Gilberto Oseguera, Ira Leventhal | 2025-07-29 |
| 12345756 | Integrated test cell using active thermal interposer (ATI) with parallel socket actuation | Karthik Ranganathan, Samer Kabbani, Gilberto Oseguera, Rohan Gupte, Homayoun Rezai +2 more | 2025-07-01 |
| 12320841 | Wafer scale active thermal interposer for device testing | Samer Kabbani, Paul Ferrari, Ikeda Hiroki, Kiyokawa Toshiyuki, Karthik Ranganathan | 2025-06-03 |
| 12320852 | Passive carrier-based device delivery for slot-based high-volume semiconductor test system | Karthik Ranganathan, Samer Kabbani, Gilberto Oseguera, Ira Leventhal, Hiroki Ikeda +1 more | 2025-06-03 |
| 12235314 | Parallel test cell with self actuated sockets | Karthik Ranganathan, Gilberto Oseguera, Joe Koeth, Ikeda Hiroki, Kiyokawa Toshiyuki | 2025-02-25 |
| 12216154 | Active thermal interposer device | Samer Kabbani, Paul Ferrari, Ikeda Hiroki, Kiyokawa Toshiyuki, Karthik Ranganathan +4 more | 2025-02-04 |
| 12210056 | Thermal array with gimbal features and enhanced thermal performance | Karthik Ranganathan, Gilberto Oseguera, Joe Koeth, Paul Ferrari, James Hastings +1 more | 2025-01-28 |
| 12203979 | Multi-input multi-zone thermal control for device testing | Karthik Ranganathan, Paul Ferrari, Samer Kabbani, Martin Fischer | 2025-01-21 |
| 12174248 | Ergonomic loading for a test interface board (TIB) / burn-in-board (BIB) in a slot-based test system | Karthik Ranganathan, Gilberto Oseguera, Toshiyuki Kiyokawa, Takayuki Shigihara | 2024-12-24 |
| 11940487 | Thermal solution for massively parallel testing | Samer Kabbani, Kazuyuki Yamashita, Ikeda Hiroki, Ira Leventhal, Mohammad Ghazvini +3 more | 2024-03-26 |
| 11852678 | Multi-input multi-zone thermal control for device testing | Karthik Ranganathan, Paul Ferrari, Samer Kabbani, Martin Fischer | 2023-12-26 |
| 11846669 | Active thermal interposer device | Samer Kabbani, Paul Ferrari, Ikeda Hiroki, Kiyokawa Toshiyuki, Karthik Ranganathan +4 more | 2023-12-19 |
| 11841392 | Integrated test cell using active thermal interposer (ATI) with parallel socket actuation | Karthik Ranganathan, Samer Kabbani, Gilberto Oseguera, Rohan Gupte, Homayoun Rezai +2 more | 2023-12-12 |
| 11835549 | Thermal array with gimbal features and enhanced thermal performance | Karthik Ranganathan, Gilberto Oseguera, Joe Koeth, Paul Ferrari, James Hastings +1 more | 2023-12-05 |
| 11808812 | Passive carrier-based device delivery for slot-based high-volume semiconductor test system | Karthik Ranganathan, Samer Kabbani, Gilberto Oseguera, Ira Leventhal, Hiroki Ikeda +1 more | 2023-11-07 |
| 11774492 | Test system including active thermal interposer device | Samer Kabbani, Paul Ferrari, Ikeda Hiroki, Kiyokawa Toshiyuki, Karthik Ranganathan +4 more | 2023-10-03 |
| 11754620 | DUT placement and handling for active thermal interposer device | Samer Kabbani, Paul Ferrari, Ikeda Hiroki, Kiyokawa Toshiyuki, Karthik Ranganathan +4 more | 2023-09-12 |
| 11742055 | Carrier based high volume system level testing of devices with pop structures | Karthik Ranganathan, Samer Kabbani, Gilberto Oseguera, Ira Leventhal | 2023-08-29 |
| 11674999 | Wafer scale active thermal interposer for device testing | Samer Kabbani, Paul Ferrari, Ikeda Hiroki, Kiyokawa Toshiyuki, Karthik Ranganathan | 2023-06-13 |
| 11656273 | High current device testing apparatus and systems | Karthik Ranganathan, Mohammad Ghazvini, Paul Ferrari, Samer Kabbani, Todd Berk | 2023-05-23 |
| 11609266 | Active thermal interposer device | Samer Kabbani, Paul Ferrari, Ikeda Hiroki, Kiyokawa Toshiyuki, Karthik Ranganathan +4 more | 2023-03-21 |
| 11587640 | Carrier based high volume system level testing of devices with pop structures | Karthik Ranganathan, Samer Kabbani, Gilberto Oseguera, Ira Leventhal | 2023-02-21 |
| 11573262 | Multi-input multi-zone thermal control for device testing | Karthik Ranganathan, Paul Ferrari, Samer Kabbani, Martin Fischer | 2023-02-07 |
| 11567119 | Testing system including active thermal interposer device | Samer Kabbani, Paul Ferrari, Ikeda Hiroki, Kiyokawa Toshiyuki, Karthik Ranganathan +4 more | 2023-01-31 |