| 12411167 |
Tension-based socket gimbal for engaging device under test with thermal array |
Gregory Cruzan, Karthik Ranganathan, Joe Koeth, Paul Ferrari, James Hastings +1 more |
2025-09-09 |
| 12374420 |
Carrier based high volume system level testing of devices with pop structures |
Karthik Ranganathan, Gregory Cruzan, Samer Kabbani, Ira Leventhal |
2025-07-29 |
| 12345756 |
Integrated test cell using active thermal interposer (ATI) with parallel socket actuation |
Karthik Ranganathan, Gregory Cruzan, Samer Kabbani, Rohan Gupte, Homayoun Rezai +2 more |
2025-07-01 |
| 12320852 |
Passive carrier-based device delivery for slot-based high-volume semiconductor test system |
Karthik Ranganathan, Gregory Cruzan, Samer Kabbani, Ira Leventhal, Hiroki Ikeda +1 more |
2025-06-03 |
| 12235314 |
Parallel test cell with self actuated sockets |
Karthik Ranganathan, Gregory Cruzan, Joe Koeth, Ikeda Hiroki, Kiyokawa Toshiyuki |
2025-02-25 |
| 12210056 |
Thermal array with gimbal features and enhanced thermal performance |
Gregory Cruzan, Karthik Ranganathan, Joe Koeth, Paul Ferrari, James Hastings +1 more |
2025-01-28 |
| 12203958 |
Shielded socket and carrier for high-volume test of semiconductor devices |
Karthik Ranganathan, Samer Kabbani, Ira Leventhal, Koji Miyauchi, Keith Schaub +3 more |
2025-01-21 |
| 12174248 |
Ergonomic loading for a test interface board (TIB) / burn-in-board (BIB) in a slot-based test system |
Karthik Ranganathan, Gregory Cruzan, Toshiyuki Kiyokawa, Takayuki Shigihara |
2024-12-24 |
| 11940487 |
Thermal solution for massively parallel testing |
Samer Kabbani, Kazuyuki Yamashita, Ikeda Hiroki, Ira Leventhal, Mohammad Ghazvini +3 more |
2024-03-26 |
| 11841392 |
Integrated test cell using active thermal interposer (ATI) with parallel socket actuation |
Karthik Ranganathan, Gregory Cruzan, Samer Kabbani, Rohan Gupte, Homayoun Rezai +2 more |
2023-12-12 |
| 11835549 |
Thermal array with gimbal features and enhanced thermal performance |
Gregory Cruzan, Karthik Ranganathan, Joe Koeth, Paul Ferrari, James Hastings +1 more |
2023-12-05 |
| 11821913 |
Shielded socket and carrier for high-volume test of semiconductor devices |
Karthik Ranganathan, Samer Kabbani, Ira Leventhal, Koji Miyauchi, Keith Schaub +3 more |
2023-11-21 |
| 11808812 |
Passive carrier-based device delivery for slot-based high-volume semiconductor test system |
Karthik Ranganathan, Gregory Cruzan, Samer Kabbani, Ira Leventhal, Hiroki Ikeda +1 more |
2023-11-07 |
| 11742055 |
Carrier based high volume system level testing of devices with pop structures |
Karthik Ranganathan, Gregory Cruzan, Samer Kabbani, Ira Leventhal |
2023-08-29 |
| 11587640 |
Carrier based high volume system level testing of devices with pop structures |
Karthik Ranganathan, Gregory Cruzan, Samer Kabbani, Ira Leventhal |
2023-02-21 |
| 11549981 |
Thermal solution for massively parallel testing |
Samer Kabbani, Kazuyuki Yamashita, Hiroki Ikeda, Ira Leventhal, Mohammad Ghazvini +3 more |
2023-01-10 |
| 11493551 |
Integrated test cell using active thermal interposer (ATI) with parallel socket actuation |
Karthik Ranganathan, Gregory Cruzan, Samer Kabbani, Rohan Gupte, Homayoun Rezai +2 more |
2022-11-08 |
| 10656200 |
High volume system level testing of devices with pop structures |
Gregory Cruzan, Karthik Ranganathan, Edward E. Sprague |
2020-05-19 |