KY

Kazuyuki Yamashita

AD Advantest: 6 patents #167 of 1,193Top 15%
TP Toyama Prefecture: 3 patents #3 of 63Top 5%
RI Richell: 3 patents #1 of 18Top 6%
AS Advantest Test Solutions: 2 patents #23 of 31Top 75%
NE Nec: 1 patents #7,889 of 14,502Top 55%
NE Nec Electronics: 1 patents #715 of 1,789Top 40%
NS Nippon Soken: 1 patents #783 of 1,540Top 55%
TO Toppan: 1 patents #51 of 177Top 30%
NU National University Corporation Okayama University: 1 patents #90 of 315Top 30%
📍 Fukuoka, CA: #5 of 11 inventorsTop 50%
Overall (All Time): #303,646 of 4,157,543Top 8%
15
Patents All Time

Issued Patents All Time

Showing 1–15 of 15 patents

Patent #TitleCo-InventorsDate
12187011 Resin molded product and manufacturing method thereof, and wavelength conversion member and illumination member Eiichi Kanaumi, Akiharu Miyanaga 2025-01-07
11940487 Thermal solution for massively parallel testing Samer Kabbani, Ikeda Hiroki, Ira Leventhal, Mohammad Ghazvini, Paul Ferrari +3 more 2024-03-26
11549981 Thermal solution for massively parallel testing Samer Kabbani, Hiroki Ikeda, Ira Leventhal, Mohammad Ghazvini, Paul Ferrari +3 more 2023-01-10
8609009 Method of producing a microproduct Takashi Onaga, Satoshi Fujiki, Hideki Morimoto, Tutomu Obata, Masayasu Suzuki 2013-12-17
7919974 Electronic device test apparatus and method of configuring electronic device test apparatus Yoshiyuki Masuo 2011-04-05
7897245 Bonded structure Mieko Omotani, Takashi Onaga, Kiyokazu Himi 2011-03-01
7800393 Electronic device test apparatus for successively testing electronic devices Akihiko Ito, Yoshihito Kobayashi 2010-09-21
7612575 Electronic device test apparatus for successively testing electronic devices Akihiko Ito, Yoshihito Kobayashi 2009-11-03
7566503 Bonded structure Mieko Omotani, Takashi Onaga, Kiyokazu Himi 2009-07-28
7511522 Electronic device test apparatus Akihiko Ito 2009-03-31
6894939 Data processor, semiconductor memory device and clock frequency detecting method 2005-05-17
6339321 Electronic device tray electronic device tray, transporting apparatus, and electronic device testing apparatus Hiroto Nakamura, Shin Nemoto 2002-01-15
6026022 Nonvolatile semiconductor memory device Kazuyuki Kusaba 2000-02-15
5757200 Lead press mechanism for IC test handler 1998-05-26
5653515 Brake control system that warns a vehicle driver responsive to excessive braking forces are being applied to a brake pedal Kenji Takeda, Mitsuo Inagaki, Toshihisa Ishihara, Shuichi Kohno 1997-08-05