Issued Patents All Time
Showing 1–25 of 27 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11417996 | Connector fitting device | — | 2022-08-16 |
| 10840623 | Board-mounting connector including cylindrical portion having slit with end portions offset from one another | Naokazu Nagasaka, Koji Miyawaki, Takashi Matsunaga | 2020-11-17 |
| 10727622 | Board-mounted connector | Takashi Matsunaga, Kazuhito Kawabe | 2020-07-28 |
| 10158189 | Connector having a housing inseparably connecting two other housings | Yoji Kutsuna, Shunsuke Narama | 2018-12-18 |
| 9601854 | Female terminal | Yoji Kutsuna | 2017-03-21 |
| 9472884 | Connector | Yoji Kutsuna | 2016-10-18 |
| 9172171 | Connector housing with fixed ended lance and removal jig for the same | — | 2015-10-27 |
| 9106017 | Terminal pullout structure of connector | Yoji Kutsuna | 2015-08-11 |
| 9028277 | Terminal locking structure in connector housing | — | 2015-05-12 |
| 7699785 | Method for determining sleep stages | — | 2010-04-20 |
| 7316171 | Biosignal intensity measuring method, bedding state judging method, and bedding state monitoring device | — | 2008-01-08 |
| 6433294 | Semiconductor device testing apparatus and semiconductor device testing system having a plurality of semiconductor device testing apparatus | Yoshihito Kobayashi, Hiroo Nakamura, Takeshi Onishi, Hiroki Ikeda | 2002-08-13 |
| 6384593 | Semiconductor device testing apparatus | Yoshihito Kobayashi, Tsuyoshi Yamashita, Hiroto Nakamura, Yoshiyuki Masuo, Akihiko Ito | 2002-05-07 |
| 6339321 | Electronic device tray electronic device tray, transporting apparatus, and electronic device testing apparatus | Kazuyuki Yamashita, Hiroto Nakamura | 2002-01-15 |
| 6271657 | Test head positioner for semiconductor device testing apparatus | — | 2001-08-07 |
| 6104183 | Semiconductor device testing apparatus | Yoshihito Kobayashi, Tsuyoshi Yamashita, Hiroto Nakamura, Yoshiyuki Masuo, Akihiko Ito | 2000-08-15 |
| 6066822 | Semiconductor device testing apparatus and semiconductor device testing system having a plurality of semiconductor device testing apparatus | Yoshihito Kobayashi, Hiroo Nakamura, Takeshi Onishi, Hiroki Ikeda | 2000-05-23 |
| 5865319 | Automatic test handler system for IC tester | Hiroshi Okuda, Hisao Hayama, Katsumi Kojima | 1999-02-02 |
| 5355017 | Lead frame having a die pad with metal foil layers attached to the surfaces | Yasuyuki Nakamura | 1994-10-11 |
| 5295296 | Method and apparatus for working a clad material | Katsumi Hagiwara, Akihiro Tanaka, Kou Sasaki, Kiyohito Nagasawa, Kazuhiro Yamamoto | 1994-03-22 |
| 5254075 | Internal circulation type centrifugal extractor | Ryo Shimizu, Hiroshi Takeda, Tomio Kawata | 1993-10-19 |
| 5234150 | Method of manufacturing spotwise partial clad material | Kazuhiro Yamamoto, Jun Okamoto, Susumu Okazaki | 1993-08-10 |
| 4857040 | High-speed centrifugal extractor having improved weirs | Hidechiyo Kashihara, Kazuhiro Ueno | 1989-08-15 |
| 4824430 | High-speed centrifugal extractor having spiral liquid path | Hidechiyo Kashihara, Kazuhiro Ueno | 1989-04-25 |
| 4598998 | Screw surface flaw inspection method and an apparatus therefor | Mitsuhito Kamei, Souji Ishimoto | 1986-07-08 |