| 7919974 |
Electronic device test apparatus and method of configuring electronic device test apparatus |
Kazuyuki Yamashita |
2011-04-05 |
| 6856128 |
Semiconductor device testing apparatus and a test tray for use in the testing apparatus |
Akihiko Ito, Yoshihito Kobayashi, Tsuyoshi Yamashita |
2005-02-15 |
| 6459259 |
Tester for semiconductor devices and test tray used for the same |
Akihiko Ito, Yoshihito Kobayashi, Tsuyoshi Yamashita |
2002-10-01 |
| 6384593 |
Semiconductor device testing apparatus |
Yoshihito Kobayashi, Tsuyoshi Yamashita, Hiroto Nakamura, Shin Nemoto, Akihiko Ito |
2002-05-07 |
| 6384360 |
IC pickup, IC carrier and IC testing apparatus using the same |
Yoshihito Kobayashi |
2002-05-07 |
| D442568 |
IC module insert |
Toshiyuki Kiyokawa, Hiroyuki Takahashi |
2001-05-22 |
| 6104183 |
Semiconductor device testing apparatus |
Yoshihito Kobayashi, Tsuyoshi Yamashita, Hiroto Nakamura, Shin Nemoto, Akihiko Ito |
2000-08-15 |