Issued Patents All Time
Showing 1–25 of 39 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11084069 | Chuck cleaner and cleaning method | Masamitsu Ito | 2021-08-10 |
| 10160014 | Chuck cleaner and cleaning method | Masamitsu Ito | 2018-12-25 |
| 9808841 | Reticle chuck cleaner and reticle chuck cleaning method | Masamitsu Itoh, Taro Inada, Jun Watanabe | 2017-11-07 |
| 9599909 | Electrostatic chuck cleaner, cleaning method, and exposure apparatus | Takashi Kamo | 2017-03-21 |
| 9348218 | Mask cleaner and cleaning method | — | 2016-05-24 |
| 8663895 | Method for manufacturing template and method for manufacturing semiconductor device | — | 2014-03-04 |
| 8551393 | Patterning method and method for manufacturing semiconductor device | — | 2013-10-08 |
| 7800393 | Electronic device test apparatus for successively testing electronic devices | Akihiko Ito, Kazuyuki Yamashita | 2010-09-21 |
| 7612575 | Electronic device test apparatus for successively testing electronic devices | Akihiko Ito, Kazuyuki Yamashita | 2009-11-03 |
| 6856128 | Semiconductor device testing apparatus and a test tray for use in the testing apparatus | Akihiko Ito, Yoshiyuki Masuo, Tsuyoshi Yamashita | 2005-02-15 |
| 6728652 | Method of testing electronic components and testing apparatus for electronic components | — | 2004-04-27 |
| 6459259 | Tester for semiconductor devices and test tray used for the same | Akihiko Ito, Yoshiyuki Masuo, Tsuyoshi Yamashita | 2002-10-01 |
| 6445203 | Electric device testing apparatus | Tsuyoshi Yamashita, Toshiyuki Kiyokawa, Hiroto Nakamura, Noriyuki Igarashi, Kenichi Shimada | 2002-09-03 |
| 6437593 | Electric device testing apparatus and electric device testing method | Akihiko Ito | 2002-08-20 |
| 6433294 | Semiconductor device testing apparatus and semiconductor device testing system having a plurality of semiconductor device testing apparatus | Shin Nemoto, Hiroo Nakamura, Takeshi Onishi, Hiroki Ikeda | 2002-08-13 |
| 6406246 | Device handler | Akihiko Itoh | 2002-06-18 |
| 6384593 | Semiconductor device testing apparatus | Tsuyoshi Yamashita, Hiroto Nakamura, Shin Nemoto, Yoshiyuki Masuo, Akihiko Ito | 2002-05-07 |
| 6384360 | IC pickup, IC carrier and IC testing apparatus using the same | Yoshiyuki Masuo | 2002-05-07 |
| 6320398 | Semiconductor device testing apparatus | Akihiko Ito | 2001-11-20 |
| D431580 | IC tray holder | Akihiko Ito | 2000-10-03 |
| 6104183 | Semiconductor device testing apparatus | Tsuyoshi Yamashita, Hiroto Nakamura, Shin Nemoto, Yoshiyuki Masuo, Akihiko Ito | 2000-08-15 |
| 6075216 | Device transfer and reinspection method for IC handler | Hiroto Nakamura, Katsuhiko Suzuki | 2000-06-13 |
| 6066822 | Semiconductor device testing apparatus and semiconductor device testing system having a plurality of semiconductor device testing apparatus | Shin Nemoto, Hiroo Nakamura, Takeshi Onishi, Hiroki Ikeda | 2000-05-23 |
| 5973493 | Test tray positioning stopper mechanism for automatic handler | Hiroto Nakamura, Makoto Sagawa | 1999-10-26 |
| 5814432 | Method of forming patterns for use in manufacturing electronic devices | — | 1998-09-29 |