NI

Noriyuki Igarashi

AD Advantest: 11 patents #75 of 1,193Top 7%
TC Takeda Riken Co.: 1 patents #7 of 26Top 30%
Overall (All Time): #425,398 of 4,157,543Top 15%
12
Patents All Time

Issued Patents All Time

Showing 1–12 of 12 patents

Patent #TitleCo-InventorsDate
7362117 Cooling fin connected to a cooling unit and a pusher of the testing apparatus Noboru Saito, Hiroyuki Takahashi, Keiichi Fukumoto, Hiroto Nakamura, Yutaka Watanabe +1 more 2008-04-22
6972581 Apparatus for handling electronic components and method for controlling temperature of electronic components Tsuyoshi Yamashita 2005-12-06
6919734 Cooling fin connected to a cooling unit and a pusher of the testing apparatus Noboru Saito, Hiroyuki Takahashi, Keiichi Fukumoto, Hiroto Nakamura, Yutaka Watanabe +1 more 2005-07-19
6663092 Holding apparatus Toshio Kashiwazaki, Haruki Nakajima 2003-12-16
6445203 Electric device testing apparatus Tsuyoshi Yamashita, Yoshihito Kobayashi, Toshiyuki Kiyokawa, Hiroto Nakamura, Kenichi Shimada 2002-09-03
6257319 IC testing apparatus Tadashi Kainuma, Noboru Masuda, Haruki Nakajima, Yuichi Nansai 2001-07-10
5894217 Test handler having turn table Kenpei Suzuki 1999-04-13
5528160 Spacing frame structure for IC handler Keiichi Fukumoto 1996-06-18
5469953 Transport mechanism for IC handlers Keiichi Fukumoto 1995-11-28
5177435 IC test equipment Toshiyuki Kiyokawa, Hisao Hayama 1993-01-05
5177469 Safety device for an IC handler and method for its operation Katsumi Kojima, Akio Kojima 1993-01-05
4691831 IC test equipment Kempei Suzuki, Yushi Iwanaga, Hiroshi Sato, Kohei Sato, Shinichi Koya 1987-09-08