Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6313654 | Device testing apparatus and test method | Takao Murayama, Katsumi Kojima | 2001-11-06 |
| 6257319 | IC testing apparatus | Tadashi Kainuma, Noboru Masuda, Haruki Nakajima, Noriyuki Igarashi | 2001-07-10 |