Issued Patents All Time
Showing 1–25 of 25 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12374420 | Carrier based high volume system level testing of devices with pop structures | Karthik Ranganathan, Gregory Cruzan, Samer Kabbani, Gilberto Oseguera | 2025-07-29 |
| 12320852 | Passive carrier-based device delivery for slot-based high-volume semiconductor test system | Karthik Ranganathan, Gregory Cruzan, Samer Kabbani, Gilberto Oseguera, Hiroki Ikeda +1 more | 2025-06-03 |
| 12203958 | Shielded socket and carrier for high-volume test of semiconductor devices | Karthik Ranganathan, Samer Kabbani, Gilberto Oseguera, Koji Miyauchi, Keith Schaub +3 more | 2025-01-21 |
| 12007428 | Systems and methods for multidimensional dynamic part average testing | Kenneth M. Butler, Constantinos Xanthopoulos, Alan D. Hart, Brian Buras, Keith Schaub | 2024-06-11 |
| 11940487 | Thermal solution for massively parallel testing | Samer Kabbani, Kazuyuki Yamashita, Ikeda Hiroki, Mohammad Ghazvini, Paul Ferrari +3 more | 2024-03-26 |
| 11821913 | Shielded socket and carrier for high-volume test of semiconductor devices | Karthik Ranganathan, Samer Kabbani, Gilberto Oseguera, Koji Miyauchi, Keith Schaub +3 more | 2023-11-21 |
| 11808812 | Passive carrier-based device delivery for slot-based high-volume semiconductor test system | Karthik Ranganathan, Gregory Cruzan, Samer Kabbani, Gilberto Oseguera, Hiroki Ikeda +1 more | 2023-11-07 |
| 11742055 | Carrier based high volume system level testing of devices with pop structures | Karthik Ranganathan, Gregory Cruzan, Samer Kabbani, Gilberto Oseguera | 2023-08-29 |
| 11587640 | Carrier based high volume system level testing of devices with pop structures | Karthik Ranganathan, Gregory Cruzan, Samer Kabbani, Gilberto Oseguera | 2023-02-21 |
| 11549981 | Thermal solution for massively parallel testing | Samer Kabbani, Kazuyuki Yamashita, Hiroki Ikeda, Mohammad Ghazvini, Paul Ferrari +3 more | 2023-01-10 |
| 11244443 | Examination apparatus, examination method, recording medium storing an examination program, learning apparatus, learning method, and recording medium storing a learning program | Kosuke Ikeda, Keith Schaub | 2022-02-08 |
| 10701571 | Automated validation and calibration portable test systems and methods | Dinesh Doshi, Mark Elston, Vipul Jain, Amit Kucheriya, Derek Diperna +1 more | 2020-06-30 |
| 10681570 | Automated configurable portable test systems and methods | Dinesh Doshi, Mark Elston, Vipul Jain, Derek Diperna, Amit Kucheriya +1 more | 2020-06-09 |
| 10548033 | Local portable test systems and methods | Dinesh Doshi, Mark Elston, Amit Kucheriya, Derek Diperna, Vipul Jain +1 more | 2020-01-28 |
| 10530499 | Methodology of using the various capabilities of the smart box to perform testing of other functionality of the smart device | Derek Diperna, Keith Schaub, Artun Kutchuk | 2020-01-07 |
| 10491314 | Smart box for automatic feature testing of smart phones and other devices | Derek Diperna, Keith Schaub, Artun Kutchuk | 2019-11-26 |
| 10432328 | Smart box for automatic feature testing of smart phones and other devices | Derek Diperna, Keith Schaub, Artun Kutchuk | 2019-10-01 |
| 10251079 | Cloud-based services for management of cell-based test systems | Dinesh Doshi, Amit Kucheriya, Liqun Liu, Vipul Jain, Derek Diperna +1 more | 2019-04-02 |
| 10171184 | Methodology of using the various capabilities of the smart box to perform testing of other functionality of the smart device | Derek Diperna, Keith Schaub, Artun Kutchuk | 2019-01-01 |
| 10158552 | Device profile-driven automation for cell-based test systems | Dinesh Doshi, Mark Elston, Derek Diperna, Vipul Jain, Liqun Liu +1 more | 2018-12-18 |
| 10020899 | Smart box for automatic feature testing of smart phones and other devices | Derek Diperna, Keith Schaub, Artun Kutchuk | 2018-07-10 |
| 9948411 | Smart box for automatic feature testing of smart phones and other devices | Derek Diperna, Keith Schaub, Artun Kutchuk | 2018-04-17 |
| 9606183 | Pseudo tester-per-site functionality on natively tester-per-pin automatic test equipment for semiconductor test | Gerald Moon, Ron Larson, Sangeet Karamchandani | 2017-03-28 |
| 9335347 | Method and apparatus for massively parallel multi-wafer test | John Andberg, Matthew Losey, Yohannes Desta, Lakshmikanth Namburi, Vincent E. Lopopolo +2 more | 2016-05-10 |
| 8091810 | Cheese crumbling device | — | 2012-01-10 |