IL

Ira Leventhal

W2 W2Bi: 11 patents #2 of 15Top 15%
AS Advantest Test Solutions: 9 patents #7 of 31Top 25%
AD Advantest: 4 patents #256 of 1,193Top 25%
Overall (All Time): #157,250 of 4,157,543Top 4%
25
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
12374420 Carrier based high volume system level testing of devices with pop structures Karthik Ranganathan, Gregory Cruzan, Samer Kabbani, Gilberto Oseguera 2025-07-29
12320852 Passive carrier-based device delivery for slot-based high-volume semiconductor test system Karthik Ranganathan, Gregory Cruzan, Samer Kabbani, Gilberto Oseguera, Hiroki Ikeda +1 more 2025-06-03
12203958 Shielded socket and carrier for high-volume test of semiconductor devices Karthik Ranganathan, Samer Kabbani, Gilberto Oseguera, Koji Miyauchi, Keith Schaub +3 more 2025-01-21
12007428 Systems and methods for multidimensional dynamic part average testing Kenneth M. Butler, Constantinos Xanthopoulos, Alan D. Hart, Brian Buras, Keith Schaub 2024-06-11
11940487 Thermal solution for massively parallel testing Samer Kabbani, Kazuyuki Yamashita, Ikeda Hiroki, Mohammad Ghazvini, Paul Ferrari +3 more 2024-03-26
11821913 Shielded socket and carrier for high-volume test of semiconductor devices Karthik Ranganathan, Samer Kabbani, Gilberto Oseguera, Koji Miyauchi, Keith Schaub +3 more 2023-11-21
11808812 Passive carrier-based device delivery for slot-based high-volume semiconductor test system Karthik Ranganathan, Gregory Cruzan, Samer Kabbani, Gilberto Oseguera, Hiroki Ikeda +1 more 2023-11-07
11742055 Carrier based high volume system level testing of devices with pop structures Karthik Ranganathan, Gregory Cruzan, Samer Kabbani, Gilberto Oseguera 2023-08-29
11587640 Carrier based high volume system level testing of devices with pop structures Karthik Ranganathan, Gregory Cruzan, Samer Kabbani, Gilberto Oseguera 2023-02-21
11549981 Thermal solution for massively parallel testing Samer Kabbani, Kazuyuki Yamashita, Hiroki Ikeda, Mohammad Ghazvini, Paul Ferrari +3 more 2023-01-10
11244443 Examination apparatus, examination method, recording medium storing an examination program, learning apparatus, learning method, and recording medium storing a learning program Kosuke Ikeda, Keith Schaub 2022-02-08
10701571 Automated validation and calibration portable test systems and methods Dinesh Doshi, Mark Elston, Vipul Jain, Amit Kucheriya, Derek Diperna +1 more 2020-06-30
10681570 Automated configurable portable test systems and methods Dinesh Doshi, Mark Elston, Vipul Jain, Derek Diperna, Amit Kucheriya +1 more 2020-06-09
10548033 Local portable test systems and methods Dinesh Doshi, Mark Elston, Amit Kucheriya, Derek Diperna, Vipul Jain +1 more 2020-01-28
10530499 Methodology of using the various capabilities of the smart box to perform testing of other functionality of the smart device Derek Diperna, Keith Schaub, Artun Kutchuk 2020-01-07
10491314 Smart box for automatic feature testing of smart phones and other devices Derek Diperna, Keith Schaub, Artun Kutchuk 2019-11-26
10432328 Smart box for automatic feature testing of smart phones and other devices Derek Diperna, Keith Schaub, Artun Kutchuk 2019-10-01
10251079 Cloud-based services for management of cell-based test systems Dinesh Doshi, Amit Kucheriya, Liqun Liu, Vipul Jain, Derek Diperna +1 more 2019-04-02
10171184 Methodology of using the various capabilities of the smart box to perform testing of other functionality of the smart device Derek Diperna, Keith Schaub, Artun Kutchuk 2019-01-01
10158552 Device profile-driven automation for cell-based test systems Dinesh Doshi, Mark Elston, Derek Diperna, Vipul Jain, Liqun Liu +1 more 2018-12-18
10020899 Smart box for automatic feature testing of smart phones and other devices Derek Diperna, Keith Schaub, Artun Kutchuk 2018-07-10
9948411 Smart box for automatic feature testing of smart phones and other devices Derek Diperna, Keith Schaub, Artun Kutchuk 2018-04-17
9606183 Pseudo tester-per-site functionality on natively tester-per-pin automatic test equipment for semiconductor test Gerald Moon, Ron Larson, Sangeet Karamchandani 2017-03-28
9335347 Method and apparatus for massively parallel multi-wafer test John Andberg, Matthew Losey, Yohannes Desta, Lakshmikanth Namburi, Vincent E. Lopopolo +2 more 2016-05-10
8091810 Cheese crumbling device 2012-01-10