Issued Patents All Time
Showing 1–14 of 14 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12007428 | Systems and methods for multidimensional dynamic part average testing | Ira Leventhal, Constantinos Xanthopoulos, Alan D. Hart, Brian Buras, Keith Schaub | 2024-06-11 |
| 10431551 | Visual identification of semiconductor dies | Kalyan Cherukuri, Stephanie W. Butler, Venkataramanan Kalyanaraman, Hubert Joseph Payne, Yazdi Dinshaw Contractor | 2019-10-01 |
| 10101386 | Real time semiconductor process excursion monitor | John Michael Carulli, Jr. | 2018-10-16 |
| 9899332 | Visual identification of semiconductor dies | Kalyan Cherukuri, Stephanie W. Butler, Venkataramanan Kalyanaraman, Hubert Joseph Payne, Yazdi Dinshaw Contractor | 2018-02-20 |
| 8344749 | Through carrier dual side loop-back testing of TSV die after die attach to substrate | Daniel Stillman, James L. Oborny, William John Antheunisse, Norman J. Armendariz, Ramyanshu Datta +1 more | 2013-01-01 |
| 8126681 | Semiconductor outlier identification using serially-combined data transform processing methodologies | Amit Nahar, John Michael Carulli, Jr., Thomas Anderson, Suresh Subramaniam | 2012-02-28 |
| 8051398 | Test method and system for characterizing and/or refining an IC design cycle | Clive Bittlestone, Mark E. Mason, Stephanie W. Butler | 2011-11-01 |
| 7865849 | System and method for estimating test escapes in integrated circuits | John Michael Carulli, Jr., Jayashree Saxena, Amit P. Vasavada | 2011-01-04 |
| 7839155 | Methods and apparatus to analyze on-chip controlled integrated circuits | — | 2010-11-23 |
| 7494829 | Identification of outlier semiconductor devices using data-driven statistical characterization | Suresh Subramaniam, Amit Nahar, Thomas Anderson, John Michael Carulli, Jr. | 2009-02-24 |
| 7203880 | Generating an abbreviated netlist including pseudopin inputs and output nodes | Srinivasa Chakravarthy, Rubin Ajit Parekhji, Julio Hernandez | 2007-04-10 |
| 7129735 | Method for test data-driven statistical detection of outlier semiconductor devices | Suresh Subramaniam, John Michael Carulli, Jr., Richard Anthony Lawrence | 2006-10-31 |
| 6697982 | Generating netlist test vectors by stripping references to a pseudo input | Srinivasa Chakravarthy, Rubin Ajit Parekhji, Julio Hernandez | 2004-02-24 |
| 5694402 | System and method for structurally testing integrated circuit devices | Theo J. Powell | 1997-12-02 |