SB

Stephanie W. Butler

TI Texas Instruments: 17 patents #768 of 12,488Top 7%
📍 Richardson, TX: #126 of 2,156 inventorsTop 6%
🗺 Texas: #7,287 of 125,132 inventorsTop 6%
Overall (All Time): #236,690 of 4,157,543Top 6%
19
Patents All Time

Issued Patents All Time

Showing 1–19 of 19 patents

Patent #TitleCo-InventorsDate
11051491 Portable pet water dispensing system 2021-07-06
10431551 Visual identification of semiconductor dies Kenneth M. Butler, Kalyan Cherukuri, Venkataramanan Kalyanaraman, Hubert Joseph Payne, Yazdi Dinshaw Contractor 2019-10-01
10334995 Decorative cover for a paper towel roll and holder 2019-07-02
9899332 Visual identification of semiconductor dies Kenneth M. Butler, Kalyan Cherukuri, Venkataramanan Kalyanaraman, Hubert Joseph Payne, Yazdi Dinshaw Contractor 2018-02-20
8051398 Test method and system for characterizing and/or refining an IC design cycle Clive Bittlestone, Kenneth M. Butler, Mark E. Mason 2011-11-01
7793186 System and method for increasing the extent of built-in self-testing of memory and circuitry Cloves Rinn Cleavelin, Andrew Marshall, Howard L. Tigelaar 2010-09-07
7752518 System and method for increasing the extent of built-in self-testing of memory and circuitry Cloves Rinn Cleavelin, Andrew Marshall, Howard L. Tigelaar 2010-07-06
7704883 Annealing to improve edge roughness in semiconductor technology Yuanning Chen 2010-04-27
7531398 Methods and devices employing metal layers in gates to introduce channel strain Zhibo Zhang, Cloves Rinn Cleavelin, Michael F. Pas, Mike Watson Goodwin, Satyavolu Srinivas Papa Rao 2009-05-12
7345355 Complementary junction-narrowing implants for ultra-shallow junctions Amitabh Jain 2008-03-18
6812073 Source drain and extension dopant concentration Haowen Bu, Amitabh Jain, Wayne Bather 2004-11-02
6808997 Complementary junction-narrowing implants for ultra-shallow junctions Amitabh Jain 2004-10-26
6787425 Methods for fabricating transistor gate structures Antonio Luis Pacheco Rotondaro, Trace Hurd, Majid Mansoori 2004-09-07
5864773 Virtual sensor based monitoring and fault detection/classification system and method for semiconductor processing equipment Gabriel G. Barna, Donald A. Sofge, David Anthony White 1999-01-26
5838595 Apparatus and method for model based process control Michael Francis Sullivan, Judith S. Hirsch, Nicholas John Tovell, Jerry Stefani, Purnendu K. Mozumder +3 more 1998-11-17
5503707 Method and apparatus for process endpoint prediction based on actual thickness measurements Sonny Maung, Steven A. Henck 1996-04-02
5458732 Method and system for identifying process conditions Keith Brankner 1995-10-17
5402367 Apparatus and method for model based process control Michael Francis Sullivan, Judith S. Hirsch, Nicholas John Tovell, Jerry Stefani, Purnendu K. Mozumder +3 more 1995-03-28
5399229 System and method for monitoring and evaluating semiconductor wafer fabrication Jerry Stefani 1995-03-21