Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7194709 | Automatic alignment of integrated circuit and design layout of integrated circuit to more accurately assess the impact of anomalies | — | 2007-03-20 |
| 6882745 | Method and apparatus for translating detected wafer defect coordinates to reticle coordinates using CAD data | David M. Schraub | 2005-04-19 |
| 6709793 | Method of manufacturing reticles using subresolution test patterns | Charles F. King, Lloyd C. Litt | 2004-03-23 |
| 6573194 | Method of growing surface aluminum nitride on aluminum films with low energy barrier | Wei-Yan Shih | 2003-06-03 |
| 6465339 | Technique for intralevel capacitive isolation of interconnect paths | Kenneth D. Brennan, Yvette Shaw | 2002-10-15 |
| 5928964 | System and method for anisotropic etching of silicon nitride | — | 1999-07-27 |
| 5458732 | Method and system for identifying process conditions | Stephanie W. Butler | 1995-10-17 |