Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9864831 | Metrology pattern layout and method of use thereof | Guoxiang Ning, Guido Ueberreiter, Paul Ackmann | 2018-01-09 |
| 9323882 | Metrology pattern layout and method of use thereof | Guoxiang Ning, Guido Ueberreiter, Paul Ackmann | 2016-04-26 |
| 6818362 | Photolithography reticle design | Kevin Lucas, Robert Boone, Wei E. Wu | 2004-11-16 |
| 6709793 | Method of manufacturing reticles using subresolution test patterns | Keith Brankner, Charles F. King | 2004-03-23 |
| 4510392 | Autoradiogram marking process | Gerald J. Litt | 1985-04-09 |