Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9864831 | Metrology pattern layout and method of use thereof | Guoxiang Ning, Lloyd C. Litt, Paul Ackmann | 2018-01-09 |
| 9817940 | Method wherein test cells and dummy cells are included into a layout of an integrated circuit | Paul Ackmann, Guoxiang Ning, Jui-Hsuan Feng, Chin Teong Lim | 2017-11-14 |
| 9672312 | Method wherein test cells and dummy cells are included into a layout of an integrated circuit | Paul Ackmann, Guoxiang Ning, Jui-Hsuan Feng, Chin Teong Lim | 2017-06-06 |
| 9535319 | Reticle, system comprising a plurality of reticles and method for the formation thereof | Guoxiang Ning, Jui-Hsuan Feng, Paul Ackmann, Chin Teong Lim | 2017-01-03 |
| 9323882 | Metrology pattern layout and method of use thereof | Guoxiang Ning, Lloyd C. Litt, Paul Ackmann | 2016-04-26 |