Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10670649 | Bondwire testing of IC using pin diode signatures | Ronald Andrew Michallick, Michael Nolan Jervis | 2020-06-02 |
| 10014810 | Reduced-impedance active current measurement | Ronald Andrew Michallick, Michael Nolan Jervis | 2018-07-03 |
| 5864773 | Virtual sensor based monitoring and fault detection/classification system and method for semiconductor processing equipment | Gabriel G. Barna, Stephanie W. Butler, Donald A. Sofge | 1999-01-26 |