Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10670649 | Bondwire testing of IC using pin diode signatures | Michael Nolan Jervis, David Anthony White | 2020-06-02 |
| 10014810 | Reduced-impedance active current measurement | David Anthony White, Michael Nolan Jervis | 2018-07-03 |
| 8947118 | Defect detection in integrated circuit devices | Michael Nolan Jervis, Rex W. Pirkle | 2015-02-03 |
| 7675272 | Output impedance compensation for linear voltage regulators | Sean Michael Malolepszy, Rex W. Pirkle | 2010-03-09 |
| 7241646 | Semiconductor device having voltage output function trim circuitry and method for same | Sean Michael Malolepszy, Marty Grabham | 2007-07-10 |