Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11686764 | Integrated circuit manufacture and outlier detection | Sirish Boddikurapati | 2023-06-27 |
| 9081051 | Methods for testing manufactured products | Ben Chia-Ming Chang, Nelson Kei Leung, Francis Eongsoo Lim | 2015-07-14 |
| 8126681 | Semiconductor outlier identification using serially-combined data transform processing methodologies | John Michael Carulli, Jr., Kenneth M. Butler, Thomas Anderson, Suresh Subramaniam | 2012-02-28 |
| 7494829 | Identification of outlier semiconductor devices using data-driven statistical characterization | Suresh Subramaniam, Thomas Anderson, Kenneth M. Butler, John Michael Carulli, Jr. | 2009-02-24 |