| 10701571 |
Automated validation and calibration portable test systems and methods |
Dinesh Doshi, Vipul Jain, Amit Kucheriya, Derek Diperna, Liqun Liu +1 more |
2020-06-30 |
|
| 10681570 |
Automated configurable portable test systems and methods |
Dinesh Doshi, Vipul Jain, Derek Diperna, Amit Kucheriya, Liqun Liu +1 more |
2020-06-09 |
|
| 10548033 |
Local portable test systems and methods |
Dinesh Doshi, Amit Kucheriya, Derek Diperna, Vipul Jain, Liqun Liu +1 more |
2020-01-28 |
|
| 10251079 |
Cloud-based services for management of cell-based test systems |
Dinesh Doshi, Amit Kucheriya, Liqun Liu, Vipul Jain, Derek Diperna +1 more |
2019-04-02 |
|
| 10158552 |
Device profile-driven automation for cell-based test systems |
Dinesh Doshi, Derek Diperna, Vipul Jain, Liqun Liu, Amit Kucheriya +1 more |
2018-12-18 |
|
| 9785526 |
Automated generation of a test class pre-header from an interactive graphical user interface |
Ankan Pramanick, Leon Chen, Chandra Pinjala |
2017-10-10 |
|
| 9785542 |
Implementing edit and update functionality within a development environment used to compile test plans for automated semiconductor device testing |
Leon Chen, Harsanjeet Singh, Hironori Maeda, Ankan Pramanick, Youbi Katsu |
2017-10-10 |
|
| 9274911 |
Using shared pins in a concurrent test execution environment |
Harsanjeet Singh, Ankan Pramanick, Leon Chen, Hironori Maeda, Chandra Pinjala +1 more |
2016-03-01 |
$66,000 |
| 8255198 |
Method and structure to develop a test program for semiconductor integrated circuits |
Ramachandran Krishnaswamy, Harsanjeet Singh, Ankan Pramanick, Leon Chen, Toshiaki Adachi +1 more |
2012-08-28 |
$47,000 |
| 8214800 |
Compact representation of vendor hardware module revisions in an open architecture test system |
Ankan Pramanick, Toshiaki Adachi |
2012-07-03 |
$90,000 |
| 8082541 |
Method and system for performing installation and configuration management of tester instrument modules |
Ankan Pramanick, Jim Hanrahan, Toshiaki Adachi, Leon Chen |
2011-12-20 |
$32,000 |
| 7543200 |
Method and system for scheduling tests in a parallel test system |
Ankan Pramanick, Toshiaki Adachi |
2009-06-02 |
$75,000 |
| 7437261 |
Method and apparatus for testing integrated circuits |
Ankan Pramanick, Leon Chen, Robert Sauer |
2008-10-14 |
$77,000 |
| 7430486 |
Datalog support in a modular test system |
Ankan Pramanick |
2008-09-30 |
$357,000 |
| 7210087 |
Method and system for simulating a modular test system |
Conrad Mukai, Ankan Pramanick, Toshiaki Adachi, Leon Chen |
2007-04-24 |
$42,000 |
| 7209851 |
Method and structure to develop a test program for semiconductor integrated circuits |
Harsanjeet Singh, Ankan Pramanick, Yoshifumi Tahara, Toshiaki Adachi |
2007-04-24 |
$42,000 |
| 7197417 |
Method and structure to develop a test program for semiconductor integrated circuits |
Ankan Pramanick, Ramachandran Krishnaswamy, Toshiaki Adachi |
2007-03-27 |
$55,000 |
| 7197416 |
Supporting calibration and diagnostics in an open architecture test system |
Toshiaki Adachi, Ankan Pramanick |
2007-03-27 |
$55,000 |
| 7184917 |
Method and system for controlling interchangeable components in a modular test system |
Ankan Pramanick, Toshiaki Adachi |
2007-02-27 |
$75,000 |