Issued Patents All Time
Showing 1–19 of 19 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10701571 | Automated validation and calibration portable test systems and methods | Dinesh Doshi, Vipul Jain, Amit Kucheriya, Derek Diperna, Liqun Liu +1 more | 2020-06-30 |
| 10681570 | Automated configurable portable test systems and methods | Dinesh Doshi, Vipul Jain, Derek Diperna, Amit Kucheriya, Liqun Liu +1 more | 2020-06-09 |
| 10548033 | Local portable test systems and methods | Dinesh Doshi, Amit Kucheriya, Derek Diperna, Vipul Jain, Liqun Liu +1 more | 2020-01-28 |
| 10251079 | Cloud-based services for management of cell-based test systems | Dinesh Doshi, Amit Kucheriya, Liqun Liu, Vipul Jain, Derek Diperna +1 more | 2019-04-02 |
| 10158552 | Device profile-driven automation for cell-based test systems | Dinesh Doshi, Derek Diperna, Vipul Jain, Liqun Liu, Amit Kucheriya +1 more | 2018-12-18 |
| 9785526 | Automated generation of a test class pre-header from an interactive graphical user interface | Ankan Pramanick, Leon Chen, Chandra Pinjala | 2017-10-10 |
| 9785542 | Implementing edit and update functionality within a development environment used to compile test plans for automated semiconductor device testing | Leon Chen, Harsanjeet Singh, Hironori Maeda, Ankan Pramanick, Youbi Katsu | 2017-10-10 |
| 9274911 | Using shared pins in a concurrent test execution environment | Harsanjeet Singh, Ankan Pramanick, Leon Chen, Hironori Maeda, Chandra Pinjala +1 more | 2016-03-01 |
| 8255198 | Method and structure to develop a test program for semiconductor integrated circuits | Ramachandran Krishnaswamy, Harsanjeet Singh, Ankan Pramanick, Leon Chen, Toshiaki Adachi +1 more | 2012-08-28 |
| 8214800 | Compact representation of vendor hardware module revisions in an open architecture test system | Ankan Pramanick, Toshiaki Adachi | 2012-07-03 |
| 8082541 | Method and system for performing installation and configuration management of tester instrument modules | Ankan Pramanick, Jim Hanrahan, Toshiaki Adachi, Leon Chen | 2011-12-20 |
| 7543200 | Method and system for scheduling tests in a parallel test system | Ankan Pramanick, Toshiaki Adachi | 2009-06-02 |
| 7437261 | Method and apparatus for testing integrated circuits | Ankan Pramanick, Leon Chen, Robert Sauer | 2008-10-14 |
| 7430486 | Datalog support in a modular test system | Ankan Pramanick | 2008-09-30 |
| 7210087 | Method and system for simulating a modular test system | Conrad Mukai, Ankan Pramanick, Toshiaki Adachi, Leon Chen | 2007-04-24 |
| 7209851 | Method and structure to develop a test program for semiconductor integrated circuits | Harsanjeet Singh, Ankan Pramanick, Yoshifumi Tahara, Toshiaki Adachi | 2007-04-24 |
| 7197417 | Method and structure to develop a test program for semiconductor integrated circuits | Ankan Pramanick, Ramachandran Krishnaswamy, Toshiaki Adachi | 2007-03-27 |
| 7197416 | Supporting calibration and diagnostics in an open architecture test system | Toshiaki Adachi, Ankan Pramanick | 2007-03-27 |
| 7184917 | Method and system for controlling interchangeable components in a modular test system | Ankan Pramanick, Toshiaki Adachi | 2007-02-27 |