Issued Patents All Time
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date | Approx Value ⓘ |
|---|---|---|---|---|
| 7437261 | Method and apparatus for testing integrated circuits | Ankan Pramanick, Mark Elston, Leon Chen | 2008-10-14 | $77,000 |
| 7089135 | Event based IC test system | Rochit Rajsuman, Shigeru Sugamori, Hiroaki Yamoto, James Alan Turnquist, Bruce R. Parnas +1 more | 2006-08-08 | $181,000 |
| 6771062 | Apparatus for supporting and manipulating a testhead in an automatic test equipment system | Niels Markert, Anthony Le | 2004-08-03 | $297,000 |
| 6747447 | Locking apparatus and loadboard assembly | Niels Markert, Anthony Le, Rochit Rajsuman, Hiroki Yamoto | 2004-06-08 | $402,000 |
| 6710590 | Test head Hifix for semiconductor device testing apparatus | Niels Markert, Anthony Le, Hiroki Yamoto | 2004-03-23 | $158,000 |
| 5951704 | Test system emulator | Kiyoshi Fukushima, Hiroaki Yamoto | 1999-09-14 | |
| 5828985 | Semiconductor test system | Jun Makino, Hiroaki Yamoto | 1998-10-27 |