Issued Patents All Time
Showing 1–15 of 15 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9785526 | Automated generation of a test class pre-header from an interactive graphical user interface | Mark Elston, Leon Chen, Chandra Pinjala | 2017-10-10 |
| 9785542 | Implementing edit and update functionality within a development environment used to compile test plans for automated semiconductor device testing | Mark Elston, Leon Chen, Harsanjeet Singh, Hironori Maeda, Youbi Katsu | 2017-10-10 |
| 9274911 | Using shared pins in a concurrent test execution environment | Mark Elston, Harsanjeet Singh, Leon Chen, Hironori Maeda, Chandra Pinjala +1 more | 2016-03-01 |
| 8255198 | Method and structure to develop a test program for semiconductor integrated circuits | Ramachandran Krishnaswamy, Harsanjeet Singh, Mark Elston, Leon Chen, Toshiaki Adachi +1 more | 2012-08-28 |
| 8214800 | Compact representation of vendor hardware module revisions in an open architecture test system | Mark Elston, Toshiaki Adachi | 2012-07-03 |
| 8082541 | Method and system for performing installation and configuration management of tester instrument modules | Jim Hanrahan, Mark Elston, Toshiaki Adachi, Leon Chen | 2011-12-20 |
| 7543200 | Method and system for scheduling tests in a parallel test system | Toshiaki Adachi, Mark Elston | 2009-06-02 |
| 7437261 | Method and apparatus for testing integrated circuits | Mark Elston, Leon Chen, Robert Sauer | 2008-10-14 |
| 7430486 | Datalog support in a modular test system | Mark Elston | 2008-09-30 |
| 7209851 | Method and structure to develop a test program for semiconductor integrated circuits | Harsanjeet Singh, Mark Elston, Yoshifumi Tahara, Toshiaki Adachi | 2007-04-24 |
| 7210087 | Method and system for simulating a modular test system | Conrad Mukai, Mark Elston, Toshiaki Adachi, Leon Chen | 2007-04-24 |
| 7197416 | Supporting calibration and diagnostics in an open architecture test system | Toshiaki Adachi, Mark Elston | 2007-03-27 |
| 7197417 | Method and structure to develop a test program for semiconductor integrated circuits | Mark Elston, Ramachandran Krishnaswamy, Toshiaki Adachi | 2007-03-27 |
| 7194668 | Event based test method for debugging timing related failures in integrated circuits | Siddharth Sawe, Rochit Rajsuman | 2007-03-20 |
| 7184917 | Method and system for controlling interchangeable components in a modular test system | Mark Elston, Toshiaki Adachi | 2007-02-27 |