| 9785526 |
Automated generation of a test class pre-header from an interactive graphical user interface |
Mark Elston, Leon Chen, Chandra Pinjala |
2017-10-10 |
| 9785542 |
Implementing edit and update functionality within a development environment used to compile test plans for automated semiconductor device testing |
Mark Elston, Leon Chen, Harsanjeet Singh, Hironori Maeda, Youbi Katsu |
2017-10-10 |
| 9274911 |
Using shared pins in a concurrent test execution environment |
Mark Elston, Harsanjeet Singh, Leon Chen, Hironori Maeda, Chandra Pinjala +1 more |
2016-03-01 |
| 8255198 |
Method and structure to develop a test program for semiconductor integrated circuits |
Ramachandran Krishnaswamy, Harsanjeet Singh, Mark Elston, Leon Chen, Toshiaki Adachi +1 more |
2012-08-28 |
| 8214800 |
Compact representation of vendor hardware module revisions in an open architecture test system |
Mark Elston, Toshiaki Adachi |
2012-07-03 |
| 8082541 |
Method and system for performing installation and configuration management of tester instrument modules |
Jim Hanrahan, Mark Elston, Toshiaki Adachi, Leon Chen |
2011-12-20 |
| 7543200 |
Method and system for scheduling tests in a parallel test system |
Toshiaki Adachi, Mark Elston |
2009-06-02 |
| 7437261 |
Method and apparatus for testing integrated circuits |
Mark Elston, Leon Chen, Robert Sauer |
2008-10-14 |
| 7430486 |
Datalog support in a modular test system |
Mark Elston |
2008-09-30 |
| 7209851 |
Method and structure to develop a test program for semiconductor integrated circuits |
Harsanjeet Singh, Mark Elston, Yoshifumi Tahara, Toshiaki Adachi |
2007-04-24 |
| 7210087 |
Method and system for simulating a modular test system |
Conrad Mukai, Mark Elston, Toshiaki Adachi, Leon Chen |
2007-04-24 |
| 7197416 |
Supporting calibration and diagnostics in an open architecture test system |
Toshiaki Adachi, Mark Elston |
2007-03-27 |
| 7197417 |
Method and structure to develop a test program for semiconductor integrated circuits |
Mark Elston, Ramachandran Krishnaswamy, Toshiaki Adachi |
2007-03-27 |
| 7194668 |
Event based test method for debugging timing related failures in integrated circuits |
Siddharth Sawe, Rochit Rajsuman |
2007-03-20 |
| 7184917 |
Method and system for controlling interchangeable components in a modular test system |
Mark Elston, Toshiaki Adachi |
2007-02-27 |