Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9274911 | Using shared pins in a concurrent test execution environment | Mark Elston, Harsanjeet Singh, Ankan Pramanick, Leon Chen, Hironori Maeda +1 more | 2016-03-01 |
| 8255198 | Method and structure to develop a test program for semiconductor integrated circuits | Harsanjeet Singh, Ankan Pramanick, Mark Elston, Leon Chen, Toshiaki Adachi +1 more | 2012-08-28 |
| 7197417 | Method and structure to develop a test program for semiconductor integrated circuits | Ankan Pramanick, Mark Elston, Toshiaki Adachi | 2007-03-27 |