Issued Patents All Time
Showing 1–12 of 12 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11156659 | Optimization and scheduling of the handling of devices in the automation process | Rotem Nahum | 2021-10-26 |
| 10677842 | DUT testing with configurable cooling control using DUT internal temperature data | Rebecca Toy | 2020-06-09 |
| 10557886 | Test system supporting multiple users using different applications | Rotem Nahum, Rebecca Toy, Padmaja Nalluri | 2020-02-11 |
| 10451668 | Test program flow control | Rotem Nahum, Rebecca Toy, Boilam Phan, Jungtsung Liu | 2019-10-22 |
| 9785542 | Implementing edit and update functionality within a development environment used to compile test plans for automated semiconductor device testing | Mark Elston, Harsanjeet Singh, Hironori Maeda, Ankan Pramanick, Youbi Katsu | 2017-10-10 |
| 9785526 | Automated generation of a test class pre-header from an interactive graphical user interface | Mark Elston, Ankan Pramanick, Chandra Pinjala | 2017-10-10 |
| 9274911 | Using shared pins in a concurrent test execution environment | Mark Elston, Harsanjeet Singh, Ankan Pramanick, Hironori Maeda, Chandra Pinjala +1 more | 2016-03-01 |
| 8255198 | Method and structure to develop a test program for semiconductor integrated circuits | Ramachandran Krishnaswamy, Harsanjeet Singh, Ankan Pramanick, Mark Elston, Toshiaki Adachi +1 more | 2012-08-28 |
| 8082541 | Method and system for performing installation and configuration management of tester instrument modules | Ankan Pramanick, Jim Hanrahan, Mark Elston, Toshiaki Adachi | 2011-12-20 |
| 7437261 | Method and apparatus for testing integrated circuits | Ankan Pramanick, Mark Elston, Robert Sauer | 2008-10-14 |
| 7210087 | Method and system for simulating a modular test system | Conrad Mukai, Ankan Pramanick, Mark Elston, Toshiaki Adachi | 2007-04-24 |
| 5883906 | Pattern data compression and decompression for semiconductor test system | James Alan Turnquist | 1999-03-16 |