| 11156659 |
Optimization and scheduling of the handling of devices in the automation process |
Rotem Nahum |
2021-10-26 |
| 10677842 |
DUT testing with configurable cooling control using DUT internal temperature data |
Rebecca Toy |
2020-06-09 |
| 10557886 |
Test system supporting multiple users using different applications |
Rotem Nahum, Rebecca Toy, Padmaja Nalluri |
2020-02-11 |
| 10451668 |
Test program flow control |
Rotem Nahum, Rebecca Toy, Boilam Phan, Jungtsung Liu |
2019-10-22 |
| 9785542 |
Implementing edit and update functionality within a development environment used to compile test plans for automated semiconductor device testing |
Mark Elston, Harsanjeet Singh, Hironori Maeda, Ankan Pramanick, Youbi Katsu |
2017-10-10 |
| 9785526 |
Automated generation of a test class pre-header from an interactive graphical user interface |
Mark Elston, Ankan Pramanick, Chandra Pinjala |
2017-10-10 |
| 9274911 |
Using shared pins in a concurrent test execution environment |
Mark Elston, Harsanjeet Singh, Ankan Pramanick, Hironori Maeda, Chandra Pinjala +1 more |
2016-03-01 |
| 8255198 |
Method and structure to develop a test program for semiconductor integrated circuits |
Ramachandran Krishnaswamy, Harsanjeet Singh, Ankan Pramanick, Mark Elston, Toshiaki Adachi +1 more |
2012-08-28 |
| 8082541 |
Method and system for performing installation and configuration management of tester instrument modules |
Ankan Pramanick, Jim Hanrahan, Mark Elston, Toshiaki Adachi |
2011-12-20 |
| 7437261 |
Method and apparatus for testing integrated circuits |
Ankan Pramanick, Mark Elston, Robert Sauer |
2008-10-14 |
| 7210087 |
Method and system for simulating a modular test system |
Conrad Mukai, Ankan Pramanick, Mark Elston, Toshiaki Adachi |
2007-04-24 |
| 5883906 |
Pattern data compression and decompression for semiconductor test system |
James Alan Turnquist |
1999-03-16 |