James Alan Turnquist has been granted 12 US patents while listed as an inventor at Advantest . The first was granted in 1999 and the most recent in August 2006. James Alan Turnquist ranks #396,045 of 4,157,543 US inventors in our database (top 9.5%). Patent records list James Alan Turnquist in Santa Clara, CA, US.
Patents per Year Patents granted per year, 1999 to 2006 Bar chart with a peak of 5 patents in 2003. peak 5 1999: 1 patents 1999 2001: 1 patents 2001 2002: 3 patents 2002 2003: 5 patents 2003 2004: 1 patents 2004 2006: 1 patents 2006
Issued Patents All Time
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Showing 1–12 of 12 patents
Patent # Title Co-Inventors Date Approx Value ⓘ
7089135 Event based IC test system Rochit Rajsuman , Shigeru Sugamori , Robert Sauer , Hiroaki Yamoto , Bruce R. Parnas +1 more 2006-08-08
$181,000
6678643 Event based semiconductor test system Shigeru Sugamori , Hiroaki Yamoto 2004-01-13
$100,000
6668331 Apparatus and method for successively generating an event to establish a total delay time that is greater than can be expressed by specified data bits in an event memory Glen Gomes , Anthony Le , Rochit Rajusman , Shigeru Sugamori 2003-12-23
$368,000
6578169 Data failure memory compaction for semiconductor test system Anthony Le , Rochit Rajsuman , Shigeru Sugamori 2003-06-10
$145,000
6567941 Event based test system storing pin calibration data in non-volatile memory Rochit Rajsuman , Shigeru Sugamori 2003-05-20
$183,000
6557128 Semiconductor test system supporting multiple virtual logic testers — 2003-04-29
$114,000
6532561 Event based semiconductor test system Shigeru Sugamori , Rochit Rajsuman , Hiroaki Yamoto 2003-03-11
$396,000
6404218 Multiple end of test signal for event based test system Anthony Le , Rochit Rajsuman , Shigeru Sugamori 2002-06-11
$46,000
6377065 Glitch detection for semiconductor test system Anthony Le , Rochit Rajsuman , Shigeru Sugamori 2002-04-23
$16,000
6360343 Delta time event based test system — 2002-03-19
$13,000
6226765 Event based test system data memory compression Anthony Le 2001-05-01
5883906 Pattern data compression and decompression for semiconductor test system Leon Chen 1999-03-16