| 7089135 |
Event based IC test system |
Rochit Rajsuman, Shigeru Sugamori, Robert Sauer, Hiroaki Yamoto, Bruce R. Parnas +1 more |
2006-08-08 |
| 6678643 |
Event based semiconductor test system |
Shigeru Sugamori, Hiroaki Yamoto |
2004-01-13 |
| 6668331 |
Apparatus and method for successively generating an event to establish a total delay time that is greater than can be expressed by specified data bits in an event memory |
Glen Gomes, Anthony Le, Rochit Rajusman, Shigeru Sugamori |
2003-12-23 |
| 6578169 |
Data failure memory compaction for semiconductor test system |
Anthony Le, Rochit Rajsuman, Shigeru Sugamori |
2003-06-10 |
| 6567941 |
Event based test system storing pin calibration data in non-volatile memory |
Rochit Rajsuman, Shigeru Sugamori |
2003-05-20 |
| 6557128 |
Semiconductor test system supporting multiple virtual logic testers |
— |
2003-04-29 |
| 6532561 |
Event based semiconductor test system |
Shigeru Sugamori, Rochit Rajsuman, Hiroaki Yamoto |
2003-03-11 |
| 6404218 |
Multiple end of test signal for event based test system |
Anthony Le, Rochit Rajsuman, Shigeru Sugamori |
2002-06-11 |
| 6377065 |
Glitch detection for semiconductor test system |
Anthony Le, Rochit Rajsuman, Shigeru Sugamori |
2002-04-23 |
| 6360343 |
Delta time event based test system |
— |
2002-03-19 |
| 6226765 |
Event based test system data memory compression |
Anthony Le |
2001-05-01 |
| 5883906 |
Pattern data compression and decompression for semiconductor test system |
Leon Chen |
1999-03-16 |