Issued Patents All Time
Showing 1–12 of 12 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7089135 | Event based IC test system | Rochit Rajsuman, Shigeru Sugamori, Robert Sauer, Hiroaki Yamoto, Bruce R. Parnas +1 more | 2006-08-08 |
| 6678643 | Event based semiconductor test system | Shigeru Sugamori, Hiroaki Yamoto | 2004-01-13 |
| 6668331 | Apparatus and method for successively generating an event to establish a total delay time that is greater than can be expressed by specified data bits in an event memory | Glen Gomes, Anthony Le, Rochit Rajusman, Shigeru Sugamori | 2003-12-23 |
| 6578169 | Data failure memory compaction for semiconductor test system | Anthony Le, Rochit Rajsuman, Shigeru Sugamori | 2003-06-10 |
| 6567941 | Event based test system storing pin calibration data in non-volatile memory | Rochit Rajsuman, Shigeru Sugamori | 2003-05-20 |
| 6557128 | Semiconductor test system supporting multiple virtual logic testers | — | 2003-04-29 |
| 6532561 | Event based semiconductor test system | Shigeru Sugamori, Rochit Rajsuman, Hiroaki Yamoto | 2003-03-11 |
| 6404218 | Multiple end of test signal for event based test system | Anthony Le, Rochit Rajsuman, Shigeru Sugamori | 2002-06-11 |
| 6377065 | Glitch detection for semiconductor test system | Anthony Le, Rochit Rajsuman, Shigeru Sugamori | 2002-04-23 |
| 6360343 | Delta time event based test system | — | 2002-03-19 |
| 6226765 | Event based test system data memory compression | Anthony Le | 2001-05-01 |
| 5883906 | Pattern data compression and decompression for semiconductor test system | Leon Chen | 1999-03-16 |