| 7596730 |
Test method, test system and assist board |
Yuya WATANABE, Shigeru Sugamori |
2009-09-29 |
| 7178115 |
Manufacturing method and apparatus to avoid prototype-hold in ASIC/SOC manufacturing |
Rochit Rajsuman |
2007-02-13 |
| 7089135 |
Event based IC test system |
Rochit Rajsuman, Shigeru Sugamori, Robert Sauer, James Alan Turnquist, Bruce R. Parnas +1 more |
2006-08-08 |
| 7089517 |
Method for design validation of complex IC |
Rochit Rajsuman |
2006-08-08 |
| 6944808 |
Method of evaluating core based system-on-a-chip |
Rochit Rajsuman |
2005-09-13 |
| 6791316 |
High speed semiconductor test system using radially arranged pin cards |
Rochit Rajsuman |
2004-09-14 |
| 6678643 |
Event based semiconductor test system |
James Alan Turnquist, Shigeru Sugamori |
2004-01-13 |
| 6678645 |
Method and apparatus for SoC design validation |
Rochit Rajsuman |
2004-01-13 |
| 6651204 |
Modular architecture for memory testing on event based test system |
Rochit Rajsuman, Shigeru Sugamori |
2003-11-18 |
| 6631340 |
Application specific event based semiconductor memory test system |
Shigeru Sugamori, Koji Takahashi |
2003-10-07 |
| 6532561 |
Event based semiconductor test system |
James Alan Turnquist, Shigeru Sugamori, Rochit Rajsuman |
2003-03-11 |
| 6370675 |
Semiconductor integrated circuit design and evaluation system using cycle base timing |
Hidenobu Matsumura, Koji Takahashi |
2002-04-09 |
| 6249889 |
Method and structure for testing embedded memories |
Rochit Rajsuman |
2001-06-19 |
| 6249891 |
High speed test pattern evaluation apparatus |
Hidenobu Matsumura, Koji Takahashi |
2001-06-19 |
| 6249892 |
Circuit structure for testing microprocessors and test method thereof |
Rochit Rajsuman |
2001-06-19 |
| 6249893 |
Method and structure for testing embedded cores based system-on-a-chip |
Rochit Rajsuman |
2001-06-19 |
| 6061283 |
Semiconductor integrated circuit evaluation system |
Koji Takahashi, Hidenobu Matsumura |
2000-05-09 |
| 5951704 |
Test system emulator |
Robert Sauer, Kiyoshi Fukushima |
1999-09-14 |
| 5828985 |
Semiconductor test system |
Robert Sauer, Jun Makino |
1998-10-27 |