Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11635374 | Optical testing apparatus | Toshihiro Sugawara, Shin Masuda, Takao Sakurai, Takao Seki | 2023-04-25 |
| 9817024 | Test carrier for mounting and testing an electronic device | Noriyuki Masuda | 2017-11-14 |
| 8604773 | Receiving apparatus, test apparatus, receiving method, and test method | Shusuke Kantake | 2013-12-10 |
| 6370675 | Semiconductor integrated circuit design and evaluation system using cycle base timing | Hiroaki Yamoto, Koji Takahashi | 2002-04-09 |
| 6249891 | High speed test pattern evaluation apparatus | Hiroaki Yamoto, Koji Takahashi | 2001-06-19 |
| 6061283 | Semiconductor integrated circuit evaluation system | Koji Takahashi, Hiroaki Yamoto | 2000-05-09 |