Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8604773 | Receiving apparatus, test apparatus, receiving method, and test method | Hidenobu Matsumura | 2013-12-10 |
| 7574316 | Pulse width adjustment circuit, pulse width adjustment method, and test apparatus for semiconductor device | Masakatsu Suda | 2009-08-11 |
| 7549099 | Testing apparatus and testing method | — | 2009-06-16 |
| 7511547 | Delay circuit, and testing apparatus | Masakatsu Suda | 2009-03-31 |
| 7460969 | Pulse width adjustment circuit, pulse width adjustment method, and test apparatus for semiconductor device | Masakatsu Suda | 2008-12-02 |