Issued Patents All Time
Showing 25 most recent of 44 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12055570 | Measurement apparatus, measurement method and computer readable medium | Masayuki Kawabata, Mitsuo Matsumoto, Shinya Sato | 2024-08-06 |
| 9871788 | Authentication terminal | Katsuhiko Degawa, Kengo Suzuki, Yushi Nishino, Kosuke Ikeda | 2018-01-16 |
| 9871789 | Authentication system, authentication method and service providing system | Katsuhiko Degawa, Kengo Suzuki, Yushi Nishino, Kosuke Ikeda | 2018-01-16 |
| 8555098 | Semiconductor circuit with load balance circuit | Tasuku Fujibe, Yoshihito Nagata | 2013-10-08 |
| 8451034 | Clock hand-off circuit | Tasuku Fujibe | 2013-05-28 |
| 8441296 | Timing generator and test apparatus | — | 2013-05-14 |
| 8375340 | Apparatus for manufacturing substrate for testing, method for manufacturing substrate for testing and recording medium | Daisuke Watanabe, Toshiyuki Okayasu | 2013-02-12 |
| 8330471 | Signal generation and detection apparatus and tester | — | 2012-12-11 |
| 8198926 | Loop type clock adjustment circuit and test device | Kazuhiro Fujita, Kazuhiro Yamamoto | 2012-06-12 |
| 8058891 | Delay lock loop circuit, timing generator, semiconductor test device, semiconductor integrated circuit, and delay amount calibration method | Takuya Hasumi | 2011-11-15 |
| 7987062 | Delay circuit, test apparatus, storage medium semiconductor chip, initializing circuit and initializing method | Kazuhiro Fujita, Takuya Hasumi | 2011-07-26 |
| 7979218 | Test apparatus, test method and computer readable medium | — | 2011-07-12 |
| 7960996 | Variable delay circuit, timing generator and semiconductor testing apparatus | — | 2011-06-14 |
| 7944263 | Timing generator and semiconductor test apparatus | — | 2011-05-17 |
| 7940072 | Timing generator and semiconductor test apparatus | — | 2011-05-10 |
| 7908110 | Test device, test method and computer readable media | — | 2011-03-15 |
| 7863990 | Oscillation circuit, test apparatus and electronic device | — | 2011-01-04 |
| 7830191 | Vernier delay circuit | Shoji Kojima | 2010-11-09 |
| 7800390 | Load fluctuation correction circuit, electronic device, testing device, and load fluctuation correction method | — | 2010-09-21 |
| 7782075 | Electronic device, load fluctuation compensation circuit, power supply, and test apparatus | — | 2010-08-24 |
| 7755407 | Variable delay circuit, testing apparatus, and electronic device | Takuya Hasumi, Satoshi Sudou | 2010-07-13 |
| 7714600 | Load fluctuation correction circuit, electronic device, testing device, and timing generating circuit | Takuya Hasumi | 2010-05-11 |
| 7696771 | Test apparatus and test method | Koichi Tanaka | 2010-04-13 |
| 7665004 | Timing generator and semiconductor testing apparatus | Masahiro Ishida, Daisuke Watanabe | 2010-02-16 |
| 7574316 | Pulse width adjustment circuit, pulse width adjustment method, and test apparatus for semiconductor device | Shusuke Kantake | 2009-08-11 |