Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8058891 | Delay lock loop circuit, timing generator, semiconductor test device, semiconductor integrated circuit, and delay amount calibration method | Masakatsu Suda | 2011-11-15 |
| 7987062 | Delay circuit, test apparatus, storage medium semiconductor chip, initializing circuit and initializing method | Kazuhiro Fujita, Masakatsu Suda | 2011-07-26 |
| 7755407 | Variable delay circuit, testing apparatus, and electronic device | Masakatsu Suda, Satoshi Sudou | 2010-07-13 |
| 7714600 | Load fluctuation correction circuit, electronic device, testing device, and timing generating circuit | Masakatsu Suda | 2010-05-11 |