| 7755407 |
Variable delay circuit, testing apparatus, and electronic device |
Takuya Hasumi, Masakatsu Suda |
2010-07-13 |
| 7558692 |
Consumption current balance circuit, compensation current amount adjusting method, timing generator, and semiconductor testing apparatus |
Masakatsu Suda |
2009-07-07 |
| 7406646 |
Multi-strobe apparatus, testing apparatus, and adjusting method |
Shinya Sato, Masaru Doi |
2008-07-29 |
| 7071746 |
Variable delay circuit |
Masakatsu Suda, Toshiyuki Okayasu |
2006-07-04 |
| 7034723 |
Timing comparator, data sampling apparatus, and testing apparatus |
Masakatsu Suda, Toshiyuki Okayasu |
2006-04-25 |
| 6987410 |
Clock recovery circuit and communication device |
Masakatsu Suda, Toshiyuki Okayasu |
2006-01-17 |
| 6903566 |
Semiconductor device tester |
Naoyoshi Watanabe |
2005-06-07 |