MD

Masaru Doi

AD Advantest: 15 patents #43 of 1,193Top 4%
NI Ngk Insulators: 2 patents #947 of 2,083Top 50%
SC Sanyo Electric Co.: 1 patents #3,644 of 6,347Top 60%
Overall (All Time): #258,346 of 4,157,543Top 7%
18
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
8601329 Test apparatus and test method Kazuhiro Shibano 2013-12-03
7945826 Test apparatus and test method Satoshi Kameda, Shinya Sato 2011-05-17
7805641 Test apparatus for regulating a test signal supplied to a device under test and method thereof Tatsuya Yamada, Shinya Satou 2010-09-28
7765449 Test apparatus that tests a plurality of devices under test having plural memory cells and test method therefor 2010-07-27
7640127 Detection apparatus, detection method, and program 2009-12-29
7634695 Test apparatus and selection apparatus 2009-12-15
7461316 Multi-strobe generation apparatus, test apparatus and adjustment method Takashi Hasegawa, Shinya Sato 2008-12-02
7407145 Core for molding hollow ceramic molded body and light emitting container Sugio Miyazawa, Shinzo Hayashi 2008-08-05
7406646 Multi-strobe apparatus, testing apparatus, and adjusting method Shinya Sato, Satoshi Sudou 2008-07-29
7363556 Testing apparatus and testing method Shinya Sato 2008-04-22
7283920 Apparatus and method for testing semiconductor device Takeo Miura 2007-10-16
7216271 Testing apparatus and a testing method Kouichi Tanaka, Shinya Sato 2007-05-08
7203611 Timing generator, test apparatus and skew adjusting method 2007-04-10
7190174 Method for calibrating timing clock 2007-03-13
7010729 Timing generator and test apparatus Shinya Sato 2006-03-07
6990613 Test apparatus Shinya Sato 2006-01-24
6953503 Method of manufacturing molded body, slurry for molding, core for molding, method of manufacturing core for molding, hollow ceramic molded body, and light emitting container Sugio Miyazawa, Shinzo Hayashi 2005-10-11
4772967 Magnetic recording apparatus in a helical scan system Hiroyuki Okuda, Yoshiaki Shimizu, Takao Yamano, Kazuo Ino, Koso Ishihara 1988-09-20