NW

Naoyoshi Watanabe

AD Advantest: 11 patents #75 of 1,193Top 7%
TL Toyota Central R&D Labs: 4 patents #276 of 1,657Top 20%
KT Kabushiki Kaisha Toshiba: 1 patents #13,537 of 21,451Top 65%
Overall (All Time): #283,295 of 4,157,543Top 7%
16
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
12241926 Test apparatus Shigeyuki Sato, Ryoichi Utsumi 2025-03-04
11828798 Test apparatus Shigeyuki Sato, Ryoichi Utsumi 2023-11-28
8880375 Test apparatus and test method Kuniyuki Kaneko 2014-11-04
7730371 Testing device, testing method, computer program product, and recording medium Tasuku Fujibe, Jun Hashimoto 2010-06-01
7230943 Wireless information processing system with wireless information recording medium and wireless information processing apparatus, and communication method therefor Hiroyuki Sakamoto, Akiko Noguchi, Hideaki Korekoda 2007-06-12
6903566 Semiconductor device tester Satoshi Sudou 2005-06-07
6574579 Waveform generating device 2003-06-03
6226230 Timing signal generating apparatus and method 2001-05-01
5958362 Method of producing active material powder for lithium secondary battery Kazumasa Takatori, Toshihiko Tani, Tsuyoshi Sasaki, Akio Takahashi, Masahiko Kato +1 more 1999-09-28
5811068 Method for producing oxide powder Kazumasa Takatori, Hideo Sobukawa 1998-09-22
5762894 Process for producing composite oxide powder containing cerium and zirconium Kazumasa Takatori, Hideo Sobukawa, Haruo Doi 1998-06-09
5764093 Variable delay circuit Yokichi Hayashi, Hiroshi Tsukahara, Katsumi Ochiai, Masuhiro Yamada 1998-06-09
5495197 Variable delay circuit Yokichi Hayashi, Hiroshi Tsukahara, Katsumi Ochiai, Masuhiro Yamada 1996-02-27
5440260 Variable delay circuit Yokichi Hayashi, Hiroshi Tsukahara, Katsumi Ochiai, Mashuhiro Yamada 1995-08-08
4998025 Device for generating strobe pulses with a desired timing 1991-03-05
4230507 Method for sulfurizing cast iron Mikio Obayashi 1980-10-28