Issued Patents All Time
Showing 25 most recent of 29 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7194668 | Event based test method for debugging timing related failures in integrated circuits | Ankan Pramanick, Siddharth Sawe | 2007-03-20 |
| 7178115 | Manufacturing method and apparatus to avoid prototype-hold in ASIC/SOC manufacturing | Hiroaki Yamoto | 2007-02-13 |
| 7089135 | Event based IC test system | Shigeru Sugamori, Robert Sauer, Hiroaki Yamoto, James Alan Turnquist, Bruce R. Parnas +1 more | 2006-08-08 |
| 7089517 | Method for design validation of complex IC | Hiroaki Yamoto | 2006-08-08 |
| 6948105 | Method of evaluating core based system-on-a-chip (SoC) and structure of SoC incorporating same | — | 2005-09-20 |
| 6944808 | Method of evaluating core based system-on-a-chip | Hiroaki Yamoto | 2005-09-13 |
| 6915469 | High speed vector access method from pattern memory for test systems | — | 2005-07-05 |
| 6804620 | Calibration method for system performance validation of automatic test equipment | Douglas A. Larson, Anthony Le, Carol Qiao Tong | 2004-10-12 |
| 6791316 | High speed semiconductor test system using radially arranged pin cards | Hiroaki Yamoto | 2004-09-14 |
| 6747447 | Locking apparatus and loadboard assembly | Niels Markert, Anthony Le, Robert Sauer, Hiroki Yamoto | 2004-06-08 |
| 6678645 | Method and apparatus for SoC design validation | Hiroaki Yamoto | 2004-01-13 |
| 6651204 | Modular architecture for memory testing on event based test system | Shigeru Sugamori, Hiroaki Yamoto | 2003-11-18 |
| 6629282 | Module based flexible semiconductor test system | Shigeru Sugamori | 2003-09-30 |
| 6594609 | Scan vector support for event based test system | Anthony Le | 2003-07-15 |
| 6578169 | Data failure memory compaction for semiconductor test system | Anthony Le, James Alan Turnquist, Shigeru Sugamori | 2003-06-10 |
| 6567941 | Event based test system storing pin calibration data in non-volatile memory | James Alan Turnquist, Shigeru Sugamori | 2003-05-20 |
| 6532561 | Event based semiconductor test system | James Alan Turnquist, Shigeru Sugamori, Hiroaki Yamoto | 2003-03-11 |
| 6408412 | Method and structure for testing embedded analog/mixed-signal cores in system-on-a-chip | — | 2002-06-18 |
| 6404218 | Multiple end of test signal for event based test system | Anthony Le, James Alan Turnquist, Shigeru Sugamori | 2002-06-11 |
| 6377065 | Glitch detection for semiconductor test system | Anthony Le, James Alan Turnquist, Shigeru Sugamori | 2002-04-23 |
| 6249893 | Method and structure for testing embedded cores based system-on-a-chip | Hiroaki Yamoto | 2001-06-19 |
| 6249889 | Method and structure for testing embedded memories | Hiroaki Yamoto | 2001-06-19 |
| 6249892 | Circuit structure for testing microprocessors and test method thereof | Hiroaki Yamoto | 2001-06-19 |
| 6108805 | Domino scan architecture and domino scan flip-flop for the testing of domino and hybrid CMOS circuits | — | 2000-08-22 |
| 5963566 | Application specific integrated circuit chip and method of testing same | Ching-Yen Ho | 1999-10-05 |