SS

Siddharth Sawe

AD Advantest: 1 patents #714 of 1,193Top 60%
Overall (All Time): #3,381,217 of 4,157,543Top 85%
1
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
7194668 Event based test method for debugging timing related failures in integrated circuits Ankan Pramanick, Rochit Rajsuman 2007-03-20