Issued Patents All Time
Showing 1–24 of 24 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11261165 | Two piece sensor assembly and method of use | Martin Leugers | 2022-03-01 |
| 9697872 | High speed serial peripheral interface memory subsystem | Kevin C. Widmer, Cliff Zitlaw | 2017-07-04 |
| 9227125 | Basketball return apparatus | — | 2016-01-05 |
| 9223726 | Apparatus and method for programmable read preamble with training pattern | Clifford Alan Zitlaw | 2015-12-29 |
| 8417874 | High speed memory having a programmable read preamble | Clifford Alan Zitlaw | 2013-04-09 |
| 7984284 | SPI auto-boot mode | Jackson Huang | 2011-07-19 |
| 7979625 | SPI bank addressing scheme for memory densities above 128Mb | Malcolm Kitchen, Jackson Huang | 2011-07-12 |
| 7437588 | Circuit card synchronization within a standardized test instrumentation chassis | Glen Gomes | 2008-10-14 |
| 7437589 | Providing precise timing control within a standardized test instrumentation chassis | Glen Gomes | 2008-10-14 |
| 7366939 | Providing precise timing control between multiple standardized test instrumentation chassis | Glen Gomes | 2008-04-29 |
| 7171602 | Event processing apparatus and method for high speed event based test system | Glen Gomes | 2007-01-30 |
| 7089135 | Event based IC test system | Rochit Rajsuman, Shigeru Sugamori, Robert Sauer, Hiroaki Yamoto, James Alan Turnquist +1 more | 2006-08-08 |
| 7010452 | Event pipeline and summing method and apparatus for event based test system | Glen Gomes | 2006-03-07 |
| 6934896 | Time shift circuit for functional and AC parametric test | Doug Larson | 2005-08-23 |
| 6804620 | Calibration method for system performance validation of automatic test equipment | Douglas A. Larson, Carol Qiao Tong, Rochit Rajsuman | 2004-10-12 |
| 6771062 | Apparatus for supporting and manipulating a testhead in an automatic test equipment system | Niels Markert, Robert Sauer | 2004-08-03 |
| 6747447 | Locking apparatus and loadboard assembly | Niels Markert, Robert Sauer, Rochit Rajsuman, Hiroki Yamoto | 2004-06-08 |
| 6710590 | Test head Hifix for semiconductor device testing apparatus | Niels Markert, Hiroki Yamoto, Robert Sauer | 2004-03-23 |
| 6668331 | Apparatus and method for successively generating an event to establish a total delay time that is greater than can be expressed by specified data bits in an event memory | Glen Gomes, James Alan Turnquist, Rochit Rajusman, Shigeru Sugamori | 2003-12-23 |
| 6594609 | Scan vector support for event based test system | Rochit Rajsuman | 2003-07-15 |
| 6578169 | Data failure memory compaction for semiconductor test system | Rochit Rajsuman, James Alan Turnquist, Shigeru Sugamori | 2003-06-10 |
| 6404218 | Multiple end of test signal for event based test system | James Alan Turnquist, Rochit Rajsuman, Shigeru Sugamori | 2002-06-11 |
| 6377065 | Glitch detection for semiconductor test system | Rochit Rajsuman, James Alan Turnquist, Shigeru Sugamori | 2002-04-23 |
| 6226765 | Event based test system data memory compression | James Alan Turnquist | 2001-05-01 |