| 11261165 |
Two piece sensor assembly and method of use |
Martin Leugers |
2022-03-01 |
| 9697872 |
High speed serial peripheral interface memory subsystem |
Kevin C. Widmer, Cliff Zitlaw |
2017-07-04 |
| 9227125 |
Basketball return apparatus |
— |
2016-01-05 |
| 9223726 |
Apparatus and method for programmable read preamble with training pattern |
Clifford Alan Zitlaw |
2015-12-29 |
| 8417874 |
High speed memory having a programmable read preamble |
Clifford Alan Zitlaw |
2013-04-09 |
| 7984284 |
SPI auto-boot mode |
Jackson Huang |
2011-07-19 |
| 7979625 |
SPI bank addressing scheme for memory densities above 128Mb |
Malcolm Kitchen, Jackson Huang |
2011-07-12 |
| 7437588 |
Circuit card synchronization within a standardized test instrumentation chassis |
Glen Gomes |
2008-10-14 |
| 7437589 |
Providing precise timing control within a standardized test instrumentation chassis |
Glen Gomes |
2008-10-14 |
| 7366939 |
Providing precise timing control between multiple standardized test instrumentation chassis |
Glen Gomes |
2008-04-29 |
| 7171602 |
Event processing apparatus and method for high speed event based test system |
Glen Gomes |
2007-01-30 |
| 7089135 |
Event based IC test system |
Rochit Rajsuman, Shigeru Sugamori, Robert Sauer, Hiroaki Yamoto, James Alan Turnquist +1 more |
2006-08-08 |
| 7010452 |
Event pipeline and summing method and apparatus for event based test system |
Glen Gomes |
2006-03-07 |
| 6934896 |
Time shift circuit for functional and AC parametric test |
Doug Larson |
2005-08-23 |
| 6804620 |
Calibration method for system performance validation of automatic test equipment |
Douglas A. Larson, Carol Qiao Tong, Rochit Rajsuman |
2004-10-12 |
| 6771062 |
Apparatus for supporting and manipulating a testhead in an automatic test equipment system |
Niels Markert, Robert Sauer |
2004-08-03 |
| 6747447 |
Locking apparatus and loadboard assembly |
Niels Markert, Robert Sauer, Rochit Rajsuman, Hiroki Yamoto |
2004-06-08 |
| 6710590 |
Test head Hifix for semiconductor device testing apparatus |
Niels Markert, Hiroki Yamoto, Robert Sauer |
2004-03-23 |
| 6668331 |
Apparatus and method for successively generating an event to establish a total delay time that is greater than can be expressed by specified data bits in an event memory |
Glen Gomes, James Alan Turnquist, Rochit Rajusman, Shigeru Sugamori |
2003-12-23 |
| 6594609 |
Scan vector support for event based test system |
Rochit Rajsuman |
2003-07-15 |
| 6578169 |
Data failure memory compaction for semiconductor test system |
Rochit Rajsuman, James Alan Turnquist, Shigeru Sugamori |
2003-06-10 |
| 6404218 |
Multiple end of test signal for event based test system |
James Alan Turnquist, Rochit Rajsuman, Shigeru Sugamori |
2002-06-11 |
| 6377065 |
Glitch detection for semiconductor test system |
Rochit Rajsuman, James Alan Turnquist, Shigeru Sugamori |
2002-04-23 |
| 6226765 |
Event based test system data memory compression |
James Alan Turnquist |
2001-05-01 |
