Anthony Le — 24 Patents at Advantest

Anthony Le has been granted 24 US patents while listed as an inventor at Advantest. The first was granted in 2001 and the most recent in March 2022. Anthony Le ranks #168,038 of 4,157,543 US inventors in our database (top 4.0%). Patent records list Anthony Le in Walnut, CA, US.

Issued Patents All Time

Showing 1–24 of 24 patents

Patent #	Title	Co-Inventors	Date	Approx Value ⓘ
11261165	Two piece sensor assembly and method of use	Martin Leugers	2022-03-01
9697872	High speed serial peripheral interface memory subsystem	Kevin C. Widmer, Cliff Zitlaw	2017-07-04
9227125	Basketball return apparatus	—	2016-01-05
9223726	Apparatus and method for programmable read preamble with training pattern	Clifford Alan Zitlaw	2015-12-29	$4,208,000
8417874	High speed memory having a programmable read preamble	Clifford Alan Zitlaw	2013-04-09	$2,664,000
7984284	SPI auto-boot mode	Jackson Huang	2011-07-19	$1,286,000
7979625	SPI bank addressing scheme for memory densities above 128Mb	Malcolm Kitchen, Jackson Huang	2011-07-12	$1,106,000
7437588	Circuit card synchronization within a standardized test instrumentation chassis	Glen Gomes	2008-10-14	$77,000
7437589	Providing precise timing control within a standardized test instrumentation chassis	Glen Gomes	2008-10-14	$77,000
7366939	Providing precise timing control between multiple standardized test instrumentation chassis	Glen Gomes	2008-04-29	$431,000
7171602	Event processing apparatus and method for high speed event based test system	Glen Gomes	2007-01-30	$24,000
7089135	Event based IC test system	Rochit Rajsuman, Shigeru Sugamori, Robert Sauer, Hiroaki Yamoto, James Alan Turnquist +1 more	2006-08-08	$181,000
7010452	Event pipeline and summing method and apparatus for event based test system	Glen Gomes	2006-03-07	$205,000
6934896	Time shift circuit for functional and AC parametric test	Doug Larson	2005-08-23	$82,000
6804620	Calibration method for system performance validation of automatic test equipment	Douglas A. Larson, Carol Qiao Tong, Rochit Rajsuman	2004-10-12	$89,000
6771062	Apparatus for supporting and manipulating a testhead in an automatic test equipment system	Niels Markert, Robert Sauer	2004-08-03	$297,000
6747447	Locking apparatus and loadboard assembly	Niels Markert, Robert Sauer, Rochit Rajsuman, Hiroki Yamoto	2004-06-08	$402,000
6710590	Test head Hifix for semiconductor device testing apparatus	Niels Markert, Hiroki Yamoto, Robert Sauer	2004-03-23	$158,000
6668331	Apparatus and method for successively generating an event to establish a total delay time that is greater than can be expressed by specified data bits in an event memory	Glen Gomes, James Alan Turnquist, Rochit Rajusman, Shigeru Sugamori	2003-12-23	$368,000
6594609	Scan vector support for event based test system	Rochit Rajsuman	2003-07-15	$113,000
6578169	Data failure memory compaction for semiconductor test system	Rochit Rajsuman, James Alan Turnquist, Shigeru Sugamori	2003-06-10	$145,000
6404218	Multiple end of test signal for event based test system	James Alan Turnquist, Rochit Rajsuman, Shigeru Sugamori	2002-06-11	$46,000
6377065	Glitch detection for semiconductor test system	Rochit Rajsuman, James Alan Turnquist, Shigeru Sugamori	2002-04-23	$16,000
6226765	Event based test system data memory compression	James Alan Turnquist	2001-05-01

Anthony Le — 24 Patents

Issued Patents All Time

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