| 7596730 |
Test method, test system and assist board |
Yuya WATANABE, Hiroaki Yamoto |
2009-09-29 |
| 7209849 |
Test system, added apparatus, and test method |
Yuya WATANABE |
2007-04-24 |
| 7089135 |
Event based IC test system |
Rochit Rajsuman, Robert Sauer, Hiroaki Yamoto, James Alan Turnquist, Bruce R. Parnas +1 more |
2006-08-08 |
| 6678643 |
Event based semiconductor test system |
James Alan Turnquist, Hiroaki Yamoto |
2004-01-13 |
| 6668331 |
Apparatus and method for successively generating an event to establish a total delay time that is greater than can be expressed by specified data bits in an event memory |
Glen Gomes, Anthony Le, James Alan Turnquist, Rochit Rajusman |
2003-12-23 |
| 6651204 |
Modular architecture for memory testing on event based test system |
Rochit Rajsuman, Hiroaki Yamoto |
2003-11-18 |
| 6631340 |
Application specific event based semiconductor memory test system |
Koji Takahashi, Hiroaki Yamoto |
2003-10-07 |
| 6629282 |
Module based flexible semiconductor test system |
Rochit Rajsuman |
2003-09-30 |
| 6578169 |
Data failure memory compaction for semiconductor test system |
Anthony Le, Rochit Rajsuman, James Alan Turnquist |
2003-06-10 |
| 6567941 |
Event based test system storing pin calibration data in non-volatile memory |
James Alan Turnquist, Rochit Rajsuman |
2003-05-20 |
| 6545460 |
Power source current measurement unit for semiconductor test system |
— |
2003-04-08 |
| 6536006 |
Event tester architecture for mixed signal testing |
— |
2003-03-18 |
| 6532561 |
Event based semiconductor test system |
James Alan Turnquist, Rochit Rajsuman, Hiroaki Yamoto |
2003-03-11 |
| 6445208 |
Power source current measurement unit for semiconductor test system |
— |
2002-09-03 |
| 6404218 |
Multiple end of test signal for event based test system |
Anthony Le, James Alan Turnquist, Rochit Rajsuman |
2002-06-11 |
| 6377065 |
Glitch detection for semiconductor test system |
Anthony Le, Rochit Rajsuman, James Alan Turnquist |
2002-04-23 |
| 6331770 |
Application specific event based semiconductor test system |
— |
2001-12-18 |
| 6314034 |
Application specific event based semiconductor memory test system |
— |
2001-11-06 |
| 6185708 |
Maintenance free test system |
— |
2001-02-06 |
| 6172544 |
Timing signal generation circuit for semiconductor test system |
— |
2001-01-09 |
| 4497056 |
IC Tester |
— |
1985-01-29 |
| 4414665 |
Semiconductor memory device test apparatus |
Kenji Kimura, Kohji Ishikawa, Naoaki Narumi |
1983-11-08 |
| 4310802 |
Logical waveform generator |
Yoshichika Ichimiya, Tsuneta Sudo, Hiromi Maruyama, Susumu Sumida, Takashi Tokuno |
1982-01-12 |
| 4270116 |
High speed data logical comparison device |
Yoshichika Ichimiya, Tsuneta Sudo, Hiromi Maruyama, Susumu Sumida, Masao Shimizu +1 more |
1981-05-26 |