Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7089135 | Event based IC test system | Rochit Rajsuman, Shigeru Sugamori, Robert Sauer, Hiroaki Yamoto, James Alan Turnquist +1 more | 2006-08-08 |
| 6978410 | Test language conversion method | — | 2005-12-20 |
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7089135 | Event based IC test system | Rochit Rajsuman, Shigeru Sugamori, Robert Sauer, Hiroaki Yamoto, James Alan Turnquist +1 more | 2006-08-08 |
| 6978410 | Test language conversion method | — | 2005-12-20 |