Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 4939677 | Timing-signal delay equipment | Taiichi Otuji | 1990-07-03 |
| 4928278 | IC test system | Taiichi Otsuji | 1990-05-22 |
| 4414665 | Semiconductor memory device test apparatus | Kenji Kimura, Shigeru Sugamori, Kohji Ishikawa | 1983-11-08 |
| 4369511 | Semiconductor memory test equipment | Kenji Kimura, Kohji Ishikawa | 1983-01-18 |
| 4300234 | Address pattern generator for testing a memory | Hiromi Maruyama, Takashi Tokuno, Masao Shimizu, Kohji Ishikawa, Osamu Ohguchi | 1981-11-10 |
| 4293950 | Test pattern generating apparatus | Masao Shimizu, Takashi Tokuno, Kohji Ishikawa, Osamu Ohguchi | 1981-10-06 |