| 10859602 |
Transferring electronic probe assemblies to space transformers |
Florent Cros |
2020-12-08 |
| 9599665 |
Low overdrive probes with high overdrive substrate |
Ting Hu |
2017-03-21 |
| 9335347 |
Method and apparatus for massively parallel multi-wafer test |
John Andberg, Ira Leventhal, Matthew Losey, Yohannes Desta, Vincent E. Lopopolo +2 more |
2016-05-10 |
| 9250290 |
Laterally driven probes for semiconductor testing |
Florent Cros, Yohannes Desta |
2016-02-02 |
| 8901950 |
Probe head for a microelectronic contactor assembly, and methods of making same |
Yohannes Desta, Matthew Losey |
2014-12-02 |
| 8305101 |
Microelectronic contactor assembly, structures thereof, and methods of constructing same |
Yohannes Desta, Chang-Chih Huang, Matthew Losey |
2012-11-06 |
| 8232818 |
Probe head for a microelectronic contactor assembly, the probe head having SMT electronic components thereon |
Yohannes Desta, Matthew Losey |
2012-07-31 |
| 7761966 |
Method for repairing a microelectromechanical system |
Raffi Garabedian |
2010-07-27 |
| 7692436 |
Probe card substrate with bonded via |
Raffi Garabedian, Salleh Ismail |
2010-04-06 |