Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9335347 | Method and apparatus for massively parallel multi-wafer test | John Andberg, Ira Leventhal, Matthew Losey, Lakshmikanth Namburi, Vincent E. Lopopolo +2 more | 2016-05-10 |
| 9250290 | Laterally driven probes for semiconductor testing | Lakshmikanth Namburi, Florent Cros | 2016-02-02 |
| 8901950 | Probe head for a microelectronic contactor assembly, and methods of making same | Lakshmikanth Namburi, Matthew Losey | 2014-12-02 |
| 8305101 | Microelectronic contactor assembly, structures thereof, and methods of constructing same | Chang-Chih Huang, Lakshmikanth Namburi, Matthew Losey | 2012-11-06 |
| 8278956 | Probecard system and method | Matt Losey, Melvin Khoo, Chang-Chih Huang | 2012-10-02 |
| 8232818 | Probe head for a microelectronic contactor assembly, the probe head having SMT electronic components thereon | Lakshmikanth Namburi, Matthew Losey | 2012-07-31 |