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Probe for testing semiconductor devices |
Ting Hu, Matthew Losey |
2013-01-01 |
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Probecard system and method |
Matt Losey, Yohannes Desta, Chang-Chih Huang |
2012-10-02 |
| 7922888 |
Post and tip design for a probe contact |
Salleh Ismail, Nim Tea, Yang Hsu, Weilong Tang, Raffi Garabedian |
2011-04-12 |
| 7772859 |
Probe for testing semiconductor devices with features that increase stress tolerance |
Nim Tea, Ting Hu, Zhiyong An |
2010-08-10 |
| 7724010 |
Torsion spring probe contactor design |
Nim Tea, Salleh Ismail, Yang Hsu, Weilong Tang, Raffi Garabedian |
2010-05-25 |
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Hybrid probe for testing semiconductor devices |
Nim Tea, Zhiyong An, Ting Hu |
2009-09-15 |
| 7538567 |
Probe card with balanced lateral force |
Shaoning Lu, Nim Tea |
2009-05-26 |
| 7362119 |
Torsion spring probe contactor design |
Nim Tea, Salleh Ismail, Yang Hsu, Weilong Tang, Raffi Garabedian |
2008-04-22 |
| 7271022 |
Process for forming microstructures |
Weilong Tang, Tseng-Yang Hsu, Salleh Ismail, Nim Tea, Raffi Garabedian +1 more |
2007-09-18 |
| 7264984 |
Process for forming MEMS |
Raffi Garabedian, Salleh Ismail, Nim Tea, Tseng-Yang Hsu, Weilong Tang |
2007-09-04 |
| 7245135 |
Post and tip design for a probe contact |
Salleh Ismail, Nim Tea, Yang Hsu, Weilong Tang, Raffi Garabedian |
2007-07-17 |