Issued Patents All Time
Showing 1–11 of 11 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8344748 | Probe for testing semiconductor devices | Ting Hu, Matthew Losey | 2013-01-01 |
| 8278956 | Probecard system and method | Matt Losey, Yohannes Desta, Chang-Chih Huang | 2012-10-02 |
| 7922888 | Post and tip design for a probe contact | Salleh Ismail, Nim Tea, Yang Hsu, Weilong Tang, Raffi Garabedian | 2011-04-12 |
| 7772859 | Probe for testing semiconductor devices with features that increase stress tolerance | Nim Tea, Ting Hu, Zhiyong An | 2010-08-10 |
| 7724010 | Torsion spring probe contactor design | Nim Tea, Salleh Ismail, Yang Hsu, Weilong Tang, Raffi Garabedian | 2010-05-25 |
| 7589542 | Hybrid probe for testing semiconductor devices | Nim Tea, Zhiyong An, Ting Hu | 2009-09-15 |
| 7538567 | Probe card with balanced lateral force | Shaoning Lu, Nim Tea | 2009-05-26 |
| 7362119 | Torsion spring probe contactor design | Nim Tea, Salleh Ismail, Yang Hsu, Weilong Tang, Raffi Garabedian | 2008-04-22 |
| 7271022 | Process for forming microstructures | Weilong Tang, Tseng-Yang Hsu, Salleh Ismail, Nim Tea, Raffi Garabedian +1 more | 2007-09-18 |
| 7264984 | Process for forming MEMS | Raffi Garabedian, Salleh Ismail, Nim Tea, Tseng-Yang Hsu, Weilong Tang | 2007-09-04 |
| 7245135 | Post and tip design for a probe contact | Salleh Ismail, Nim Tea, Yang Hsu, Weilong Tang, Raffi Garabedian | 2007-07-17 |