Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Probe for testing semiconductor devices with features that increase stress tolerance

Probe for testing semiconductor devices with features that increase stress tolerance

US Patent 7772859 · Granted Aug 10, 2010

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Device and method for sensor calibration2020
Methods for stiction reduction in MEMS sensors2018
Device and method for sensor calibration2017
Low overdrive probes with high overdrive substrate2017
Fine pitch probes for semiconductor testing, and a method to fabricate and assem2015
Methods for stiction reduction in MEMS sensors2015
Fine pitch probes for semiconductor testing, and a method to fabricate and assem2015
Heat dissipation for electronic modules2014
Probe for testing semiconductor devices2013
Probe for testing semiconductor devices2013
Probecard system and method2012
Heat dissipation for electronic modules2011