Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Probe card with balanced lateral force

Probe card with balanced lateral force

US Patent 7538567 · Granted May 26, 2009

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Device and method for sensor calibration2020
Methods for stiction reduction in MEMS sensors2018
Device and method for sensor calibration2017
Methods for stiction reduction in MEMS sensors2015
Probe for testing semiconductor devices2013
Probecard system and method2012
Post and tip design for a probe contact2011
Post and tip design for a probe contact2011
Probe for testing semiconductor devices with features that increase stress toler2010
Probe for testing semiconductor devices with features that increase stress toler2010
Method of forming probe card assembly2010
Probe card assembly and method of forming same2010