Issued Patents All Time
Showing 1–19 of 19 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10297339 | Integrated cooling system for electronics testing apparatus | Brent Thordarson, Koei Nishiura | 2019-05-21 |
| 9335347 | Method and apparatus for massively parallel multi-wafer test | Ira Leventhal, Matthew Losey, Yohannes Desta, Lakshmikanth Namburi, Vincent E. Lopopolo +2 more | 2016-05-10 |
| 9128122 | Stiffener plate for a probecard and method | — | 2015-09-08 |
| 8354853 | Test electronics to device under test interfaces, and methods and apparatus using same | Sanjeev Grover, Donald W. Chiu | 2013-01-15 |
| 7859277 | Apparatus, systems and methods for processing signals between a tester and a plurality of devices under test at high temperatures and with single touchdown of a probe array | Romi Mayder, Pam Stellmacher, Edmundo Dela Puente | 2010-12-28 |
| 7541822 | Wafer burn-in and text employing detachable cartridge | Frank O. Uher, Mark C. Carbone, Donald P. Richmond, II | 2009-06-02 |
| 7541824 | Forced air cooling of components on a probecard | Romi Mayder | 2009-06-02 |
| 7501844 | Liquid cooled DUT card interface for wafer sort probing | Romi Mayder | 2009-03-10 |
| 7460371 | Wiffle tree components, cooling systems, and methods of attaching a printed circuit board to a heat sink | Romi Mayder | 2008-12-02 |
| 7459921 | Method and apparatus for a paddle board probe card | Romi Mayder | 2008-12-02 |
| 7193854 | Using a leaf spring to attach clamp plates with a heat sink to both sides of a component mounted on a printed circuit assembly | Paul Bonomo | 2007-03-20 |
| 7147499 | Zero insertion force printed circuit assembly connector system and method | Romi Mayder, Don Chiu, Noriyuki Sugihara | 2006-12-12 |
| 7088117 | Wafer burn-in and test employing detachable cartridge | Frank O. Uher, Mark C. Carbone, Donald P. Richmond, II | 2006-08-08 |
| 6787718 | Device, method, and system for detecting the presence of liquid in proximity to electronic components | Stephen Jerry Chaikin | 2004-09-07 |
| 6580283 | Wafer level burn-in and test methods | Mark C. Carbone, Frank O. Uher, Jerzy Lobacz, Donald P. Richmond, II | 2003-06-17 |
| 6556032 | Wafer-burn-in and test employing detachable cartridge | Frank O. Uher, Mark C. Carbone, Donald P. Richmond, II | 2003-04-29 |
| 6413113 | Kinematic coupling | Frank O. Uher, Mark C. Carbone, Donald P. Richmond, II | 2002-07-02 |
| 6340895 | Wafer-level burn-in and test cartridge | Frank O. Uher, Mark C. Carbone, Donald P. Richmond, II | 2002-01-22 |
| 6140616 | Wafer level burn-in and test thermal chuck and method | — | 2000-10-31 |